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Image-Based Quality Control for Additive Manufacturing through Layer-by-Layer Analysis

Year: 2026

Type: conference-paper

Source: IISE Annual Conference & Expo

DOI: 10.21872/annual2025_8813

Authors: Jesus Diaz, Chaitanya Mahajan, Unaffiliated, Casey Tran, Satyajayant Misra, Srikanthan Ramesh

Language: English

Topic: Additive Manufacturing and 3D Printing Technologies

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W7214992567

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