Work

Reliability-aware waveform measurement framework for intermittent fault localization in analog circuits

Year: 2026

Type: article

Source: Measurement Science and Technology

DOI: 10.1088/1361-6501/aebab7

Authors: Junyou Shi, Zhenyang Lv

Institution: Beihang University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7224123352

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