Work

An Intermittent Fault Diagnosis Framework for Analog Circuits Based on Transient Morphology-Aware Feature Enhancement and Boundary-Aware Segment-Consistency Learning

Year: 2026

Type: article

Source: Cybernetics & Systems

DOI: 10.1080/01969722.2026.2758733

Authors: Junyou Shi, Zhenyang Lv, Jiayi Zhang, Shuqiang Liu

Institutions: National Key Laboratory of Science and Technology on Reliability and Environmental Engineering, Beihang University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7225314372

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Cites: 28

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Related to: 10