Work

Soft-error tolerant design and assessment of the system-on-chip circuit for space application

Year: 2026

Type: article

Source: International Journal of Electronics

DOI: 10.1080/00207217.2026.2759975

Authors: Haiwei Xue, Fangfa Fu, Mengfei Xing, Xinqiang Li, Jinxiang Wang, Jing Shen, Xiaoyan Qiang, Bing Ji

Institutions: Harbin Institute of Technology, China Electronics Technology Group Corporation

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7225638408

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Cites: 11

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