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Chemical and Topographical Microanalysis with High Spatial Resolution

Year: 2000

Type: article

Source: NASA Technical Reports Server (NASA)

Authors: Dmitri Kossakovski, Gregory H. Bearman, James Beauchamp, Joseph L. Kirschvink

Language: English

Topic: Electron and X-Ray Spectroscopy Techniques

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W773832485

FWCI:

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