Work

Reordering of test vector using artificial intelligence approach for power reduction during VLSI testing

Year: 2010

Type: conference-paper

Source: International Conference on Networking

Authors: K. P. Anitha, K. Paramasivam

Institution: Bannari Amman Institute of Technology

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W83483949

FWCI: 0.18

Cites: 11

Cited by: 2

Related to: 10