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C. Guichet
Observed names:
Christophe Guichet,
Guichet, C.,
Guichet, Christophe
Institutions:
Centre National de la Recherche Scientifique,
Université de Toulon,
Aix-Marseille Université,
Institut des Matériaux, de Microélectronique et des Nanosciences de Provence
Observed institutions:
Centre National de la Recherche Scientifique,
Université de Toulon,
Aix-Marseille Université,
Institut des Matériaux, de Microélectronique et des Nanosciences de Provence
ORCID:
0000-0002-1381-3110
Observed ORCID:
0000-0002-1381-3110
OpenAlex ID:
A5000507174
Fast pole figure acquisition using area detectors at the DiffAbs beamline – Synchrotron SOLEIL
2013
·
Cristian Mocuta
, Marie-Ingrid Richard
, et al.
·
Journal of Applied Crystallography
·
63
PDF
Evolution of Crystal Structure During the Initial Stages of ZnO Atomic Layer Deposition
2016
·
R. Boichot
, L. Tian
, et al.
·
Chemistry of Materials
·
40
PDF
New insights into thermomechanical behavior of GeTe thin films during crystallization
2020
·
Marion Gallard
, Mohamed Salah Amara
, et al.
·
Acta Materialia
·
32
PDF
Impact of surface preparation on nickel–platinum alloy silicide phase formation
2007
·
B. Imbert
, C. Guichet
, et al.
·
Microelectronic Engineering
·
19
In situ monitoring of stress change in GeTe thin films during thermal annealing and crystallization
2018
·
B. Ben Yahia
, M.S. Amara
, et al.
·
Micro and Nano Engineering
·
17
PDF
Silicide formation during reaction between Ni ultra-thin films and Si(001) substrates
2013
·
J. Fouet
, M. Texier
, et al.
·
Materials Letters
·
15
Microstructural analysis of AU/NI multilayers interfaces by SAXS and STM
2002
·
S. Labat
, C. Guichet
, et al.
·
Applied Surface Science
·
15
Stress buildup during crystallization of thin chalcogenide films for memory applications: In situ combination of synchrotron X-Ray diffraction and wafer curvature measurements
2016
·
T. Ouled-Khachroum
, M.-I. Richard
, et al.
·
Thin Solid Films
·
12
Continuous and Collective Grain Rotation in Nanoscale Thin Films during Silicidation
2015
·
M.-I. Richard
, J. Fouet
, et al.
·
Physical Review Letters
·
11
Exploring Pd–Si(001) and Pd–Si(111) thin-film reactions by simultaneous synchrotron X-ray diffraction and substrate curvature measurements
2012
·
M.-I. Richard
, J. Fouet
, et al.
·
Thin Solid Films
·
10
Fast pole figure acquisition using area detectors at the DiffAbs beamline – Synchrotron SOLEIL. Erratum
2013
·
Cristian Mocuta
, Marie-Ingrid Richard
, et al.
·
Journal of Applied Crystallography
·
9
PDF
In situ combined synchrotron X-ray diffraction and wafer curvature measurements during formation of thin palladium silicide film on Si(0 0 1) and Si (1 1 1)
2011
·
J. Fouet
, M.-I. Richard
, et al.
·
Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms
·
8
Electrical and ion beam analyses of yttrium and yttrium-titanium getter thin films oxidation
2021
·
Clément Bessouet
, Sylvain Lemettre
, et al.
·
Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena
·
6
Stress Buildup Upon Crystallization of GeTe Thin Films: Curvature Measurements and Modelling
2020
·
Rajkiran Tholapi
, Manon Gallard
, et al.
·
Nanomaterials
·
5
PDF
Hydrogen sorption in yttrium-based getter thin films
2022
·
Charlotte Kutyla
, Clément Bessouet
, et al.
·
Vacuum
·
4
Computer processing of electron microscope cross sections of multilayer mirrors
1997
·
M. O. Flaissier
, C. Guichet
, et al.
·
Applied Optics
·
3
Structural and magnetic properties of Ni/Cr multilayers
1997
·
D. Boursier
, B. Chenevier
, et al.
·
Journal of Magnetism and Magnetic Materials
·
3
Manufacturing and testing of a laterally graded division parameter multilayer inferential mirror for XUV
1994
·
Christophe Guichet
, R. Rivoira
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
3
Understanding crystallization in undoped and nitrogen doped GeTe thin films using substrate curvature measurements
2023
·
Piyush Jagtap
, Christophe Guichet
, et al.
·
Materialia
·
2
PDF
Laterally graded division parameter layered synthetic microstructures
1994
·
C. Guichet
, R. Rivoira
, et al.
·
Microscopy Microanalysis Microstructures
·
2
PDF
Influence of the Number of Bilayers on the Optical Performances of X-UV Multilayer Interferential Mirrors
1997
·
C. Guichet
, R. Rivoira
, et al.
·
Journal of X-Ray Science and Technology
·
1
Microstructure influence on getter properties of Zr-V thin films for vacuum microelectromechanical system packaging
2026
·
Sylvain Lemettre
, Clément Bessouet
, et al.
·
Thin Solid Films
Thermal activation of co-evaporated Ti, Zr and V-based binary and ternary getter alloy thin films: characterization by electrical measurements during hydrogenation
2025
·
Sylvain Lemettre
, Charlotte Kutyla
, et al.
·
Vacuum
Activation and gas sorption of Y-based getter films for wafer-level vacuum packaging of microsensors
2022
·
Kutyla, Charlotte
, Bessouet, Clément
, et al.
·
HAL AMU
Etude par faisceaux d’ions de la sorption en hydrogène de matériaux getter à base d’yttrium
2022
·
Kutyla, Charlotte
, Bessouet, Clément
, et al.
·
HAL
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Works count:
45
Citation count:
280
H-index:
10
I10-index:
10
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