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Hao-Wei Chuang
Observed name:
Hao-wei Chuang
Observed institution:
National Chung Shan Institute of Science and Technology
OpenAlex ID:
A5000757096
High thermal stability and low hysteresis dispersion AlGaN/GaN MOS-HEMTs with zirconia film design
2012
·
Chao-Hung Chen
, Hsien-Chin Chiu
, et al.
·
Microelectronics Reliability
·
21
Sidewall defects of AlGaN/GaN HEMTs evaluated by low frequency noise analysis
2013
·
Hsien-Chin Chiu
, Chao-Hung Chen
, et al.
·
Microelectronics Reliability
·
10
Performance improvement mechanisms of i-ZnO/(NH4)2S -treated AlGaN MOS diodes
2012
·
Ching-Ting Lee
, Ya-Lan Chiou
, et al.
·
Applied Surface Science
·
10
Low gate interface traps AlGaN/GaN HEMTs using a lattice matched ZrZnO transparent gate design
2013
·
Hsien-Chin Chiu
, Hsiang-Chun Wang
, et al.
·
Microelectronics Reliability
·
1
Monolithic Vertically Stacking 3D 16-nm FinFET 1-Transistor-and-4-Metal-Fuses (1T4F) One-time-programmable Memory (OTP) MACRO
2026
·
Kai Wen Cheng
, Wei-Da Lin
, et al.
·
International Conference on Solid State Devices and Materials (SSDM)
Low frequency noise in field-plate multigate AlGaN/GaN single-pole–single-throw RF switches on silicon substrate
2012
·
Hsien-Chin Chiu
, Chao-Wei Lin
, et al.
·
Microelectronics Reliability
Electrical Performance of Chlorine-Treated AlGaN MOS Diodes with i-ZnO Insulator
2011
·
Ya-Lan Chiou
, Ching-Ting Lee
, et al.
·
ECS Transactions
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Works count:
7
Citation count:
42
H-index:
3
I10-index:
3
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