Author

Hao-Wei Chuang

Observed name: Hao-wei Chuang
OpenAlex ID: A5000757096
2012 · Chao-Hung Chen, Hsien-Chin Chiu, et al. · Microelectronics Reliability · 21
2013 · Hsien-Chin Chiu, Chao-Hung Chen, et al. · Microelectronics Reliability · 10
2012 · Ching-Ting Lee, Ya-Lan Chiou, et al. · Applied Surface Science · 10
2013 · Hsien-Chin Chiu, Hsiang-Chun Wang, et al. · Microelectronics Reliability · 1
2026 · Kai Wen Cheng, Wei-Da Lin, et al. · International Conference on Solid State Devices and Materials (SSDM)
2012 · Hsien-Chin Chiu, Chao-Wei Lin, et al. · Microelectronics Reliability
2011 · Ya-Lan Chiou, Ching-Ting Lee, et al. · ECS Transactions
Works count: 7
Citation count: 42
H-index: 3
I10-index: 3
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