Author

T Matsukawa

Observed name: Takashi Matsukawa

Institutions: Semiconductor Frontier Research Center, National Institute of Advanced Industrial Science and Technology

Observed institutions: Semiconductor Frontier Research Center, National Institute of Advanced Industrial Science and Technology

OpenAlex ID: A5002838554

(Invited) Charge Trapping Type SOI-FinFET Flash Memory

2014 · Yongxun Liu, T Nabatame, et al. · ECS Meeting Abstracts · 1

A Smart Stopper-Less CMP Technology With Optical Monitors for Nano-Scale Control of the Amorphous Si Film Thickness on 3D-Structured FinFETs and GAAFETs

2026 · Yuji Kasashima, Takashi Matsukawa, et al. · IEEE Transactions on Semiconductor Manufacturing

等電子トラップ技術に基づくI_on増強による相補TFET回路の性能の改善【Powered by NICT】

2016 · T Mori, H Asai, et al. · IEEE Conference Proceedings

C-3-51 Monolithic Integration of MOSFET and Thermo-optic Switch on Photonic SOI Platform

2013 · T Matsukawa, Takashi Chiba, et al. · 電子情報通信学会ソサイエティ大会講演論文集

Works count: 4

Citation count: 1

H-index: 1

I10-index: