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P.J.A. van de Wiel
Institution:
NXP (Germany)
Observed institution:
NXP (Germany)
OpenAlex ID:
A5003569747
Modeling Power Supply Noise in Delay Testing
2007
·
Jing Wang
, D.M. Walker
, et al.
·
IEEE Design & Test of Computers
·
28
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Works count:
1
Citation count:
28
H-index:
1
I10-index:
1
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