Work

Modeling Power Supply Noise in Delay Testing

Year: 2007

Type: article

Source: IEEE Design & Test of Computers

DOI: 10.1109/mdt.2007.76

Authors: Jing Wang, D.M. Walker, Xiang Lu, A. Majhi, B. Kruseman, G. Gronthoud, L.E. Villagra, P.J.A. van de Wiel, S. Eichenberger

Institutions: Texas A&M University, SEMI, NXP (Germany)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funders: National Science Foundation, Texas A and M University

OpenAlex ID: W2054718237

FWCI: 6.718

Cites: 15

Cited by: 28

Related to: 10