Author

Felix Hoyean Kim

Observed names: F. H. Kim, F. Kim, F.H. Kim, Felix H Kim, Felix H. Kim, Felix Kim, Kim, F.H., Kim, Felix, Kim, Felix H., Kim, Felix Hoyean
ORCID: 0000-0002-1042-9500
Observed ORCID: 0000-0002-1042-9500
OpenAlex ID: A5011960016
2018 · Felix H Kim, Shawn P Moylan · 176
2011 · N. Kardjilov, M. Dawson, et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 76
2012 · Felix H. Kim, Dayakar Penumadu, et al. · Journal of Geotechnical and Geoenvironmental Engineering · 70
2011 · Felix H. Kim, Dayakar Penumadu, et al. · Journal of Geotechnical and Geoenvironmental Engineering · 59
2019 · Felix H. Kim, Adam L. Pintar, et al. · Journal of Manufacturing Science and Engineering · 46
2016 · Anne K. Turner, Felix H. Kim, et al. · Computers and Geotechnics · 31
2015 · Felix Hoyean Kim, Dayakar Penumadu, et al. · International Journal of Impact Engineering · 23
2019 · Bala Muralikrishnan, Megan Shilling, et al. · Journal of Research of the National Institute of Standards and Technology · 20
2020 · Max Praniewicz, Brandon Lane, et al. · Journal of Research of the National Institute of Standards and Technology · 13
2019 · Bala Muralikrishnan, Megan Shilling, et al. · Journal of Research of the National Institute of Standards and Technology · 11
2023 · Ho Yeung, Felix Kim, et al. · ASME International Manufacturing Science and Engineering Conference (MSEC) · 9
2019 · Ward L. Johnson, Justin G. Whiting, et al. · AIP conference proceedings · 8
2019 · Bala Muralikrishnan, Meghan Shilling, et al. · Dimensional Optical Metrology and Inspection for Practical Applications · 7
Works count: 55
Citation count: 944
H-index: 15
I10-index: 20
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