Work

X-ray computed tomography instrument performance evaluation: Detecting geometry errors using a calibrated artifact

Year: 2019

Type: conference-paper

Source: Dimensional Optical Metrology and Inspection for Practical Applications

DOI: 10.1117/12.2518108

Authors: Bala Muralikrishnan, Meghan Shilling, Steve Phillips, Wei Ren, Vincent Lee, Felix Kim, Gabriel Alberts, Valentina Aloisi

Institution: National Institute of Standards and Technology

Language: English

Topic: Advanced Measurement and Metrology Techniques

Subfield: Mechanical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2946089751

FWCI: 3.401

Cites: 4

Cited by: 7

Related to: 10