Author

Daniel Haško

Observed names: D G Hasko, D Hasko, D Haško, D. G. Hasko, D. Hasko, D. Haško, D. Haško, Daniel Hasko, Daniel HaÅ¡ko

Institution: Slovak Centre of Scientific and Technical Information

Observed institutions: Jiwaji University, Slovak University of Technology in Bratislava, University of Cambridge, Wuhan University, International Laser Center, Slovak Centre of Scientific and Technical Information, Sylex (Slovakia), Vorarlberg University of Applied Sciences, Comenius University Bratislava

ORCID: 0000-0003-4254-0817

Observed ORCID: 0000-0003-4254-0817

OpenAlex ID: A5014107191

Preparation and properties of thin parylene layers as the gate dielectrics for organic field effect transistors

2008 · J. Jakabovič, J. Kováč, et al. · Microelectronics Journal · 94

Structural and optical properties of sputtered ZnO thin films

2007 · S. Flickyngerova, K. Shtereva, et al. · Applied Surface Science · 75

Annealing and recrystallization of amorphous ZnO thin films deposited under cryogenic conditions by pulsed laser deposition

2011 · J. Bruncko, A. Vincze, et al. · Thin Solid Films · 41

Growth and Properties of Sprayed CZTS Thin Films

2018 · Tarun Chandel, Vikas Thakur, et al. · Journal of Electronic Materials · 38

Advanced antifouling zwitterionic layer based impedimetric HER2 biosensing in human serum: Glycoprofiling as a novel approach for breast cancer diagnostics

2018 · Erika Chocholova, Tomas Bertok, et al. · Sensors and Actuators B Chemical · 35

Soft Hydrogel Zwitterionic Coatings Minimize Fibroblast and Macrophage Adhesion on Polyimide Substrates

2018 · Dušana Trel’ová, Alice Rita Salgarella, et al. · Langmuir · 35

Nanolithography using ultrasonically assisted development of calixarene negative electron beam resist

2001 · Shazia Yasin, D. G. Hasko, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 31

Wafer-scale transfer of nanoimprinted patterns into silicon substrates

2008 · G. Hubbard, S.J. Abbott, et al. · Physica E Low-dimensional Systems and Nanostructures · 23

Grain Boundary Effect on Charge Transport in Pentacene Thin Films

2011 · Martin Weis, Katarína Gmucová, et al. · Japanese Journal of Applied Physics · 16

Nanopendeo coalescence overgrowth of GaN on etched nanorod array

2011 · Philip Shields, Chaowang Liu, et al. · Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics · 15

Avalanche photodiode with sectional InGaAsP/InP charge layer

2005 · D. Haško, J. Kováč, et al. · Microelectronics Journal · 15

Stress investigation of the AlGaN/GaN micromachined circular diaphragms of a pressure sensor

2014 · J Dzuba, G Vanko, et al. · Journal of Micromechanics and Microengineering · 13

AFM surface analysis of ZnO layers prepared by pulsed laser deposition at different oxygen pressures

2009 · Daniel Haško, Jaroslav Bruncko · Vacuum · 13

Structural, electrical and optical properties of ZnO/Si structures prepared by sputtering or pulsed laser deposition

2008 · J Škriniarová, J Kovác, et al. · Journal of Physics Conference Series · 12

Functionality of novel black silicon based nanostructured surfaces studied by TOF SIMS

2009 · Ivan Talian, Monika Aranyosiova, et al. · Applied Surface Science · 11

A combined X‐ray, ellipsometry and atomic force microscopy study on thin parylene‐C films

2009 · Heinz‐Georg Flesch, Oliver Werzer, et al. · physica status solidi (a) · 11

Characterization of the degradation process of Si-PCPDTBT:PC70BM(1:2) blend layers deposited on ITO/glass substrate

2014 · M. Seck, A. Vincze, et al. · Solar Energy Materials and Solar Cells · 10

Preparation and properties of ZnO layers grown by various methods

2008 · A. Vincze, J. Kováč, et al. · Applied Surface Science · 8

SiC-based cermet with electrically conductive grain boundaries

2010 · M. Balog, J. Kováč, et al. · Materials Characterization · 6

Comparative study of ZnO layers prepared by PLD from different targets at various oxygen pressure levels

2009 · Daniel HaÅ¡ko, Jaroslav Bruncko, et al. · Open Physics · 6

Structural and optical characterization of photonics structures prepared by nanoimprint technology

2008 · Daniel Hasko, Jaroslav Kovác, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 5

Properties of MOVPE GaN grown on ZnO deposited on Si(001) and Si(111) substrates

2008 · R. Paszkiewicz, B. Paszkiewicz, et al. · Journal of Crystal Growth · 5

Mixed 2D molecular systems: Mechanic, thermodynamic and dielectric properties

2008 · Juraj Beňo, Martin Weis, et al. · Applied Surface Science · 5

Identification of the crystalline-phases in thin pentacene layers by Raman spectroscopy

2011 · Rudolf Srnánek, Ján Jakabovič, et al. · Vacuum · 4

Large area diffraction-based inspection of submicron periodic structures

2008 · Milan Držík, Alexander Šatka, et al. · Microelectronic Engineering · 4

Works count: 51

Citation count: 565

H-index: 13

I10-index: 17