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Author

Seunghee Jin

Institution: Korea University
Observed institution: Korea University
ORCID: 0009-0003-1278-771X
Observed ORCID: 0009-0003-1278-771X
OpenAlex ID: A5015474883
Defect Engineering for High Performance and Extremely Reliable a‐IGZO Thin‐Film Transistor in QD‐OLED
2022 · Young‐Gil Park, Dong Yeon Cho, et al. · Advanced Electronic Materials · 39
Automatic Prediction of Metal–Oxide–Semiconductor Field‐Effect Transistor Threshold Voltage Using Machine Learning Algorithm
2022 · Seoyeon Choi, Dong Geun Park, et al. · Advanced Intelligent Systems · 17
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Comparative analysis of Schottky barriers for heterogeneous defect domains in monolayer WS2 field-effect transistors
2022 · Jungchun Kim, Gwang Hwi An, et al. · Applied Surface Science · 14
Interrelation between ferroelectric properties and defects based on low-frequency noise analysis of HZO ferroelectric capacitor
2023 · Seunghee Jin, Juye Jeon, et al. · Applied Physics Letters · 10
Interface engineering of 9X stacked 3D NAND flash memory using hydrogen post-treatment annealing
2022 · Saeyan Choi, Seungsob Kim, et al. · Nanotechnology · 4
Automatic prediction of MOSFETs threshold voltage by machine learning algorithms
2023 · Seoyeon Choi, Dong Geun Park, et al. · IEEE Electron Devices Technology & Manufacturing Conference (EDTM) · 3
Probing defects in 3D NAND flash memory with temperature-dependent leakage current
2026 · Donghyun Kim, Sae-In Bang, et al. · AIP Advances
Works count: 7
Citation count: 87
H-index: 4
I10-index: 4
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