Work

Interrelation between ferroelectric properties and defects based on low-frequency noise analysis of HZO ferroelectric capacitor

Year: 2023

Type: article

Source: Applied Physics Letters

DOI: 10.1063/5.0140714

Authors: Seunghee Jin, Juye Jeon, Min Jung Kim, Kiseok Heo, Jeong Hun Kim, Jong-Pil Im, Sung-Min Yoon, Seung Eon Moon, Jiyong Woo, Jae Woo Lee

Institutions: Korea University, Samsung Electronics (South Korea), Electronics and Telecommunications Research Institute, Kyung Hee University, Korea University of Science and Technology, Kyungpook National University

Language: English

Topic: Ferroelectric and Negative Capacitance Devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4367175877

FWCI: 0.713

Cites: 26

Cited by: 10

Related to: 10