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Shintaro Yabu

Observed name: SHINTARO YABU
Institution: Ushio (Japan)
Observed institution: Ushio (Japan)
OpenAlex ID: A5019727995
Imprint-mold-cleaning by Vacuum Ultraviolet Light
2010 · MASASHI NAKAO, MASANORI YAMAGUCHI, et al. · Journal of Nonlinear Optical Physics & Materials · 10
A Photo-Desmear Method for Via Residue Removal Using a VUV Light Source
2013 · Tomoyuki Habu, Shintaro Yabu, et al. · IMAPSource Proceedings · 8
Large Scale Photodesmear for Via Residue Cleaning in High Density Interconnect substrates
2015 · Tomoyuki Habu, Masahito Namai, et al. · IMAPSource Proceedings · 7
Improvement of Coherency of the Panel Level Package by Integrated Dry Process
2016 · Shinichi Endo, Tomoyuki Habu, et al. · IMAPSource Proceedings · 6
Full-Sized Panel Photodesmear for Via Residue Cleaning
2016 · Masahito Namai, Akira Aiba, et al. · IEEE Electronic Components and Technology Conference (ECTC) · 6
New desmear process of organic substrate applications by Photodesmear technology
2017 · Shinichi Endo, Tomoyuki Habu, et al. · International Microsystems, Packaging, Assembly and Circuits Technology Conference · 5
Result of Highly Accelerated Stress Test of Organic Substrate Made by Integrated Dry Process
2020 · Shinichi Endo, Tomoyuki Habu, et al. · Transactions of The Japan Institute of Electronics Packaging · 3
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Reliability Test of Organic Substrate Processed by Newly Desmear Method "PhotodesmearTM"
2018 · Shinichi Endo, Tomoyuki Habu, et al. · IEEE Electronic Components and Technology Conference (ECTC) · 1
Result of high accelerated stress test of organic substrate made by integrated dry process
2019 · Shinichi Endo, Shintaro Yabu, et al. · International Conference on Electronics Packaging (ICEP)
Result of high accelerated stress test of organic substrates made by integrated dry process
2018 · Tomoyuki Habu, Shinichi Endo, et al. · IMAPSource Proceedings
Regeneration of imprint molds using vacuum ultraviolet light
2011 · Masashi Nakao, Masanori Yamaguchi, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
Works count: 11
Citation count: 46
H-index: 5
I10-index: 1
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