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Klaus Prume

Observed names: K. Prume, Prume, K., Prume, Klaus
OpenAlex ID: A5031574400
Dynamic leakage current compensation in ferroelectric thin-film capacitor structures
2005 · René Meyer, Rainer Waser, et al. · Applied Physics Letters · 171
Piezoelectric thin films: evaluation of electrical and electromechanical characteristics for MEMS devices
2007 · K. Prume, P. Muralt, et al. · IEEE Transactions on Ultrasonics Ferroelectrics and Frequency Control · 94
Direct hysteresis measurements of single nanosized ferroelectric capacitors contacted with an atomic force microscope
2001 · S. Tiedke, T. Schmitz, et al. · Applied Physics Letters · 74
Finite‐Element Analysis of Ceramic Multilayer Capacitors: Failure Probability Caused by Wave Soldering and Bending Loads
2000 · Klaus Franken, Horst R. Maier, et al. · Journal of the American Ceramic Society · 48
Analysis of shape effects on the piezoresponse in ferroelectric nanograins with and without adsorbates
2005 · F. Peter, A. Rüdiger, et al. · Applied Physics Letters · 41
Effects of the top-electrode size on the piezoelectric properties (d33 and S) of lead zirconate titanate thin films
2004 · P. Gerber, A. Roelofs, et al. · Journal of Applied Physics · 39
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Modelling and numerical simulation of the electrical, mechanical, and thermal coupled behaviour of Multilayer capacitors (MLCs)
2002 · Klaus Prume, Klaus Franken, et al. · Journal of the European Ceramic Society · 33
Extensive electromechanical characterization of PZT thin films for MEMS applications by electrical and mechanical excitation signals
2007 · Klaus Prume, Paul Muralt, et al. · Journal of Electroceramics · 30
Chemically derived seeding layer for {100}-textured PZT thin films
2007 · F. Tyholdt, F. Calame, et al. · Journal of Electroceramics · 26
In-situ compensation of the parasitic capacitance for nanoscale hysteresis measurements
2003 · T. Schmitz, K. Prume, et al. · Journal of the European Ceramic Society · 24
High-rate sputtering of thick PZT thin films for MEMS
2010 · Harald Jacobsen, Klaus Prume, et al. · Journal of Electroceramics · 21
Compensation of the Parasitic Capacitance of a Scanning Force Microscope Cantilever Used for Measurements on Ferroelectric Capacitors of Submicron Size by Means of Finite Element Simulations
2002 · Klaus Prume, Andreas Roelofs, et al. · Japanese Journal of Applied Physics · 21
Taking piezoelectric microsystems from the laboratory to production
2007 · H. Ræder, F. Tyholdt, et al. · Journal of Electroceramics · 20
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Finite‐Element Analysis of Ceramic Multilayer Capacitors: Modeling and Electrical Impedance Spectroscopy for a Nondestructive Failure Test
2000 · Klaus Prume, Rainer Waser, et al. · Journal of the American Ceramic Society · 20
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Simulation and measurements of the piezoelectric properties response (d/sub 33/) of piezoelectric layered thin film structures influenced by the top-electrode size
2005 · K. Prume, P. Gerber, et al. · IEEE International Symposium on Applications of Ferroelectrics (ISAF) · 11
Effective Piezoelectric Coefficients of Ferroelectric Thin Films on Elastic Substrates
2008 · Nicolas Zalachas, Bernd Laskewitz, et al. · Journal of Intelligent Material Systems and Structures · 8
Electrical Characterization of Ferroelectrics
2004 · Klaus Prume, Thorsten Schmitz, et al. · Wiley eBooks · 7
A simple and powerful analytical model for MEMS piezoelectric multimorphs
2007 · W. E. Booij, A. H. Vogl, et al. · Journal of Electroceramics · 6
Finite-element simulation of coupled characteristics of ceramic multilayer capacitors under transient electrical loading
2002 · K. Prume, R. Waser · IEEE International Symposium on Applications of Ferroelectrics (ISAF) · 4
Electrical measurements on capacitor sizes in the submicron regime for the characterization of real memory cell capacitors
2001 · T. Schmitz, K. Prume, et al. · Integrated ferroelectrics · 4
Finite element simulations of interdigital electrode structures on high permittivity thin films
2001 · K. Prume, S. Hoffmann, et al. · Integrated ferroelectrics · 4
Tensile and compressive stress dependency of the transverse (e31,f) piezoelectric coefficient of PZT thin films for MEMS devices
2007 · Klaus Prume, Paul Muralt, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 3
3-Dimensional FEM simulations of resonances in the impedance characteristic of ceramic multilayer capacitors
1999 · Klaus Prume, Timm Leuerer, et al. · Ferroelectrics · 1
Electrical and electromechanical characterization of piezoelectric thin films in view of MEMS application
2007 · S. Tiedke, K. Prume, et al. · IEEE International Symposium on Applications of Ferroelectrics (ISAF)
Electrical Characterization of Ferroelectric Properties in the Sub‐Micrometer Scale
2004 · T. Schmitz, Stephan Tiedke, et al. · Wiley eBooks
Works count: 29
Citation count: 710
H-index: 14
I10-index: 15
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