Author

Zsolt John Laczik

Observed names: Laczik, Zsolt J., Laczik, Zsolt John, Z Laczik, Z. J. Laczik, Z. LACZIK, Z. Laczik, Z.J. Laczik, Zsolt J. Laczik, Zsolt J. Laczik (3970655), Zsolt John Laczik (3971048), Zsolt Laczik

Observed institutions: University of Oxford, Hungarian Academy of Sciences

OpenAlex ID: A5032865472

Electromagnetic diffraction of light focused through a planar interface between materials of mismatched refractive indices: an integral representation

1995 · P. Török, P. Varga, et al. · Journal of the Optical Society of America A · 455

3D manipulation of particles into crystal structures using holographic optical tweezers

2004 · Jonathan Leach, Gavin Sinclair, et al. · Optics Express · 213

Interactive approach to optical tweezers control

2006 · Jonathan Leach, Kurt Wulff, et al. · Applied Optics · 157

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Assembly of 3-dimensional structures using programmable holographic optical tweezers

2004 · Gavin Sinclair, Pamela Jordan, et al. · Optics Express · 156

Interactive application in holographic optical tweezers of a multi-plane Gerchberg-Saxton algorithm for three-dimensional light shaping

2004 · Gavin Sinclair, Jonathan Leach, et al. · Optics Express · 154

Dynamic manipulation of Bose-Einstein condensates with a spatial light modulator

2006 · V. Boyer, R. M. Godun, et al. · Physical Review A · 137

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Optimized pupil-plane filters for confocal microscope point-spread function engineering

2000 · M. A. A. Neil, R. Juškaitis, et al. · Optics Letters · 106

Dynamic optical trap generation using FLC SLMs for the manipulation of cold atoms

2004 · V. Boyer, C. M. Chandrashekar, et al. · Journal of Modern Optics · 28

The scanning infrared microscope (SIRM) and its application to bulk GaAs and Si: a review

1992 · G R Booker, Z Laczik, et al. · Semiconductor Science and Technology · 28

Nondestructive characterization of nitrogen-implanted silicon-on-insulator structures by spectroscopic ellipsometry

1989 · M. Fried, T. Lohner, et al. · Journal of Applied Physics · 23

Electromagnetic diffraction of light focused through a planar interface between materials of mismatched refractive indices: an integral representation: errata

1995 · P. Török, P. Varga, et al. · Journal of the Optical Society of America A · 20

Gettering and Gettering Stability of Metals at Oxide Particles in Silicon

1992 · R. Falster, Z. Laczik, et al. · MRS Proceedings · 17

Investigation of oxide particles in Czochralski silicon heat treated for intrinsic gettering using scanning infrared microscopy

1989 · Z. Laczik, G. R. Booker, et al. · Applied Physics Letters · 15

Discrete-dipole-approximation-based light-scattering calculations for particles with a real refractive index smaller than unity

1996 · Z. Laczik · Applied Optics · 13

Quantitative Makyoh topography

2000 · Zsolt J. Laczik · Optical Engineering · 11

Effect of half-stop lateral misalignment on imaging of dark-field and stereoscopic confocal microscopes

1996 · P. Török, Z. Laczik, et al. · Applied Optics · 11

Non-destructive characterization of nitrogen-implanted silicon-on-insulator structures by spectroscopic ellipsometry

1989 · M. Fried, T. Lohner, et al. · Materials Science and Engineering B · 11

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Simple modification of a commercial scanning laser microscope to incorporate dark‐field imaging

1996 · P. TÖRÖK, Z. LACZIK, et al. · Journal of Microscopy · 9

Thermal processing induced plastic deformation in GaAs wafers

2001 · P. Möck, Z.J. Laczik, et al. · Materials Science and Engineering B · 7

Residual polishing damage and surface quality of commercial InP wafers: A scanning PL study

1996 · Z. Laczik, G.R. Booker, et al. · Materials Science and Engineering B · 6

Gettering of Copper and Nickel in Czochralski Silicon by Oxide Particles: Dependence on Oxide Particle Density and Cooling Rate

1991 · Z. Laczik, Robert J. Falster, et al. · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena · 6

Gettering of Copper and Nickel in Czochralski Silicon by Oxide Particles: Assessment of Thermal Stability

1991 · Robert J. Falster, Z. Laczik, et al. · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena · 6

Scanning Infra-Red Microscope Investigation of Oxide Particles in Czochralski Silicon Heat-Treated for Intrinsic Gettering

1989 · Z. Laczik, G.R. Booker, et al. · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena · 6

3D beam shaping using diffractive optical elements

2002 · Zsolt J. Laczik · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 5

Assessment of residual subsurface polishing damage in InP wafers by photoluminescence

1996 · Z. Laczik, G.R. Booker, et al. · Journal of Crystal Growth · 5

Works count: 49

Citation count: 1,624

H-index: 13

I10-index: 17