Work

Gettering of Copper and Nickel in Czochralski Silicon by Oxide Particles: Dependence on Oxide Particle Density and Cooling Rate

Year: 1991

Type: article

Source: Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena

DOI: 10.4028/www.scientific.net/ssp.19-20.39

Authors: Z. Laczik, Robert J. Falster, G.R. Booker

Institution: SunEdison (United States)

Language: English

Topic: Silicon and Solar Cell Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2028699489

FWCI: 1.792

Cites:

Cited by: 6

Related to: 10