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F. Darracq

Art Painting Diagnostic Before Restoration with Terahertz and Millimeter Waves
2017 · Jean-Paul Guillet, M. Roux, et al. · Journal of Infrared Millimeter and Terahertz Waves · 59
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Terahertz imaging and tomography as efficient instruments for testing polymer additive manufacturing objects
2016 · J. B. Perraud, A. F. Obaton, et al. · Applied Optics · 58
Backside SEU laser testing for commercial off-the-shelf SRAMs
2002 · F. Darracq, H. Lapuyade, et al. · IEEE Transactions on Nuclear Science · 57
Influence of Laser Pulse Duration in Single Event Upset Testing
2006 · A. Douin, V. Pouget, et al. · IEEE Transactions on Nuclear Science · 48
Investigation on the SEL Sensitive Depth of an SRAM Using Linear and Two-Photon Absorption Laser Testing
2011 · E. Faraud, V. Pouget, et al. · IEEE Transactions on Nuclear Science · 37
TCAD simulation capabilities towards gate leakage current analysis of advanced AlGaN/GaN HEMT devices
2017 · K. Mukherjee, F. Darracq, et al. · Microelectronics Reliability · 30
Laser cross section measurement for the evaluation of single-event effects in integrated circuits
2000 · V. Pouget, P. Fouillat, et al. · Microelectronics Reliability · 29
Fundamentals of the Pulsed Laser Technique for Single-Event Upset Testing
2007 · Pascal Fouillat, Vincent Pouget, et al. · Springer eBooks · 23
The Hardness-Intensity Correlation in Bright Gamma-Ray Bursts
1997 · J.-P. Dezalay, J.-L. Atteia, et al. · The Astrophysical Journal · 21
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Evaluation of Recent Technologies of Nonvolatile RAM
2008 · Thierry Nuns, Sophie Duzellier, et al. · IEEE Transactions on Nuclear Science · 20
Low-frequency noise effect on terahertz tomography using thermal detectors
2015 · J. P. Guillet, B. Recur, et al. · Applied Optics · 17
Characterization and modeling of laser-induced single-event burn-out in SiC power diodes
2013 · N. Mbaye, V. Pouget, et al. · Microelectronics Reliability · 17
Single-event sensitivity of a single SRAM cell
2002 · F. Darracq, T. Beauchene, et al. · IEEE Transactions on Nuclear Science · 16
Evaluation of recent technologies of non-volatile RAM
2007 · T. Nuns, S. Duzellier, et al. · European Conference on Radiation and Its Effects on Components and Systems · 12
Impact of negative bias temperature instability on the single-event upset threshold of a 65nm SRAM cell
2013 · I. El Moukhtari, V. Pouget, et al. · Microelectronics Reliability · 11
Investigation on the Single Event Burnout Sensitive Volume Using Two-Photon Absorption Laser Testing
2012 · Frédéric Darracq, Nogaye Mbaye, et al. · IEEE Transactions on Nuclear Science · 11
Negative Bias Temperature Instability Effect on the Single Event Transient Sensitivity of a 65 nm CMOS Technology
2013 · I. El Moukhtari, Vincent Pouget, et al. · IEEE Transactions on Nuclear Science · 10
Imaging the Single Event Burnout sensitive volume of vertical power MOSFETs using the laser Two-Photon Absorption technique
2011 · F. Darracq, N. Mbaye, et al. · European Conference on Radiation and Its Effects on Components and Systems · 10
Investigation of single event burnout sensitive depth in power MOSFETS
2009 · F. Darracq, V. Pouget, et al. · European Conference on Radiation and Its Effects on Components and Systems · 10
Application of various optical techniques for ESD defect localization
2006 · F. Essely, F. Darracq, et al. · Microelectronics Reliability · 10
Tunable ultrafast infrared generation in a gas-filled hollow-core capillary by a four-wave mixing process
2022 · Olivia Zurita-Miranda, Coralie Fourcade-Dutin, et al. · Journal of the Optical Society of America B · 9
Optimizing Pulsed OBIC Technique for ESD Defect Localization
2007 · Fabien Essely, Nicolas Guitard, et al. · IEEE Transactions on Device and Materials Reliability · 8
Evaluation of a design methodology dedicated to dose-rate-hardened linear integrated circuits
2002 · Y. Deval, H. Lapuyade, et al. · IEEE Transactions on Nuclear Science · 7
Frequency modulated continuous wave terahertz imaging for art restoration
2016 · J. P. Guillet, K. Wang, et al. · International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz) · 6
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Frequency Modulated Continuous Wave Terahertz Imaging For Art Restoration
2016 · Mounaix, Patrick, Darracq, Frederic, et al. · HAL (Le Centre pour la Communication Scientifique Directe) · 5
Works count: 85
Citation count: 588
H-index: 13
I10-index: 20
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