Work

Fundamentals of the Pulsed Laser Technique for Single-Event Upset Testing

Year: 2007

Type: book-chapter

Source: Springer eBooks

DOI: 10.1007/978-1-4020-5646-8_6

Authors: Pascal Fouillat, Vincent Pouget, Dale McMorrow, Frédéric Darracq, Stephen Buchner, Dean LEWIS

Institutions: Centre National de la Recherche Scientifique, Université de Bordeaux, Université Bordeaux-I, United States Naval Research Laboratory, Seabrook

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W87908487

FWCI: 0.913

Cites: 22

Cited by: 23

Related to: 10