Author

Naoya Shibata

Observed names: N Shibata, Shibata, Naoya

Institutions: Japan Fine Ceramics Center, Institute of Engineering Innovation, School of Engineering, the University of Tokyo, The University of Tokyo

Observed institutions: Japan Fine Ceramics Center, Institute of Engineering Innovation, School of Engineering, the University of Tokyo, The University of Tokyo

ORCID: 0000-0003-3548-5952

Observed ORCID: 0000-0003-3548-5952

OpenAlex ID: A5035101288

Enhancing Dose Efficiency of Optimum Bright‐Field Scanning Transmission Electron Microscopy Using a Phase‐Shifted Electron Probe

2026 · Mitsuru Nogami, Takehito Seki, et al. · Small Methods · 1

A strategy for dose-efficient atomic-resolution OBF-STEM imaging of zeolites

2026 · Kousuke Ooe, Takehito Seki, et al. · Microscopy · 1

Electromagnetic Field Imaging in Quantum and Magnetic Materials

2026 · Naoya Shibata · Microscopy and Microanalysis

Mapping Electromagnetic Fields and Atomic Thermal Vibrations Using tDPC-STEM and Atomic-Scale TDS Analysis

2026 · Takehito Seki, Satoko Toyama, et al. · Microscopy and Microanalysis

Development of the 300 kV Magnetic Field-Free Atomic Resolution Electron Microscope

2026 · Yuji Kohno, Tatsuhiro Maekawa, et al. · Microscopy and Microanalysis

Automatic Aberration Correction Using 4D-STEM: Development and Demonstration

2026 · Konosuke Oe, Koudai Tabata, et al. · Microscopy and Microanalysis

Vogel spiral-based tilt-scan averaging approach for robust and efficient diffraction contrast suppression in DPC STEM

2026 · Ayumu Oyaizu, Satoko Toyama, et al. · Microscopy

Three-Dimensional Atomic-Scale Structural Transformation in a SrTiO3 Grain Boundary

2026 · Gao, Xiaoyue, Wei, Jiake, et al. · arXiv (Cornell University)

In situ biasing DPC STEM observation of GaAs p–n junction

2026 · Satoko Toyama, Yoshifumi Kojima, et al. · Microscopy

Erratum: “Enhanced transport properties in GaN heterostructures with sputter-epitaxy-grown ScAlN barriers via thermal annealing” [Appl. Phys. Lett. 127 , 182103 (2025)]

2026 · Tomoya Okuda, Shunsuke Ota, et al. · Applied Physics Letters

Direct determination of local exchange stiffness in M-type ferrites via domain-wall analysis with tilt-scan-averaged DPC STEM

2026 · Yoshiki O. Murakami, Takehito Seki, et al. · Physical Review Materials

Atomic-Resolution STEM-EDS Mapping of Grain Boundary Solute Segregation in Yttria-Stabilized Zirconia – RETRACTION

2015 · B Feng, A Kumamoto, et al. · Microscopy and Microanalysis

Works count: 12

Citation count: 2

H-index: 1

I10-index: