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Direct determination of local exchange stiffness in M-type ferrites via domain-wall analysis with tilt-scan-averaged DPC STEM

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Year: 2026
Type: article
Source: Physical Review Materials
DOI: 10.1103/wt54-nm7b
Authors: Yoshiki O. Murakami, Takehito Seki, Yoshinori Kobayashi, Tsunehiro Kawata, Naoya Shibata
Institutions: The University of Tokyo, Japan Science and Technology Agency, Proterial, Ltd. (Japan), Japan Fine Ceramics Center
Language: English

Topic: Magnetic properties of thin films
Subfield: Condensed Matter Physics
Field: Physics and Astronomy
Domain: Physical Sciences

Open Access status: closed

Funders: Ministry of Education, Culture, Sports, Science and Technology, Japan Society for the Promotion of Science, Precursory Research for Embryonic Science and Technology, Exploratory Research for Advanced Technology
Awards: Development of atomic-resolution magnetic field imaging electron microscopy and its application to interface characterization in magnetic materials, G3000782242, G3621842209, 走査透過電子顕微鏡による原子分解能熱振動イメージング法の開発と応用, 材料・デバイス界面空間電荷層直接観察手法の開発と応用, G8127183437, G8560748074
OpenAlex ID: W7140877039
FWCI:
Cites: 32
Cited by:
Related to: 10
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