Author

Stephen T. Palmacci

Observed names: S. Palmacci, S. T. Palmacci, Stephen Palmacci
OpenAlex ID: A5035787652
1997 · T. M. Bloomstein, M. W. Horn, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 107
1994 · Howard H. Bengele, Stephen Palmacci, et al. · Magnetic Resonance Imaging · 84
2007 · M. W. Geis, S. J. Spector, et al. · Optics Express · 73
1998 · T. M. Bloomstein, M. Rothschild, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 66
2004 · M. Rothschild, T. M. Bloomstein, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 53
1997 · C. K. Walker, Gopal Narayanan, et al. · Softwaretechnik-Trends · 34
2008 · C. M. Wynn, S. Palmacci, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 22
2012 · C. M. Wynn, S. Palmacci, et al. · Applied Physics Letters · 14
2002 · V. Liberman, M. Rothschild, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 14
2013 · Charles M. Wynn, Stephen T. Palmacci, et al. · Optical Engineering · 12
1999 · A. M. Young, T. M. Bloomstein, et al. · Journal of Biomechanical Engineering · 12
2007 · V. Liberman, M. Rothschild, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 8
2005 · V. Liberman, S. T. Palmacci, et al. · Optical Microlithography XVIII · 8
1998 · Christopher K. Walker, Aimee L. Hungerford, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 8
2001 · Vladimir Liberman, Mordechai Rothschild, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 7
2008 · V. Liberman, M. Rothschild, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 6
2007 · Vladimir Liberman, Mordechai Rothschild, et al. · Journal of Micro/Nanopatterning Materials and Metrology · 6
2001 · Theodore M. Bloomstein, Vladimir Liberman, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 6
1994 · N. Nassuphis, R. H. Mathews, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 6
2008 · Paul A. Zimmerman, Jeffrey Byers, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 5
2002 · Theodore M. Bloomstein, Vladimir Liberman, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 5
2001 · Theodore M. Bloomstein, Vladimir Liberman, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 5
Works count: 40
Citation count: 723
H-index: 12
I10-index: 14
Year
Topic
Type