Author

Byung-Ha Joo

Observed name: B.S. Joo

Institutions: Samsung (South Korea), Samsung Electronics (South Korea)

Observed institutions: Samsung (South Korea), Samsung Electronics (South Korea)

OpenAlex ID: A5035973349

Advanced delay analysis method for submicron ASIC technology

2003 · Eui-Young Chung, Byung-Ha Joo, et al. · Annual IEEE International ASIC Conference and Exhibit · 3

A DRAM technology using MIM BST capacitor for 0.15 /spl mu/m DRAM generation and beyond

1999 · K.N. Kim, D.H. Kwak, et al. · Symposium on VLSI Technology · 3

Works count: 2

Citation count: 6

H-index: 2

I10-index: