Author

Marco Haverlag

Observed names: Haverlag, M Marco, Haverlag, M., Haverlag, Marco, M Haverlag, M. A. Haverlag, M. Haverlag
OpenAlex ID: A5041601965
1994 · G. S. Oehrlein, Y. Zhang, et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 198
1996 · M. Haverlag, W. W. Stoffels, et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 84
1991 · A. Kono, M. Haverlag, et al. · Journal of Applied Physics · 83
2008 · A Sobota, A Lebouvier, et al. · Journal of Physics D Applied Physics · 71
1994 · M. Haverlag, E. Stoffels, et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 71
1996 · M. Haverlag, E. Stoffels, et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 47
1995 · E. Stoffels, W. W. Stoffels, et al. · Contributions to Plasma Physics · 43
1994 · M. Haverlag, G. S. Oehrlein, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 43
1991 · J L Jauberteau, G J Meeusen, et al. · Journal of Physics D Applied Physics · 38
1991 · M. Haverlag, G. M. W. Kroesen, et al. · Plasma Chemistry and Plasma Processing · 33
2010 · M F Gendre, M Haverlag, et al. · Journal of Physics D Applied Physics · 32
1996 · Yunjie Xu, S. Civiš, et al. · Molecular Physics · 31
1989 · J. L. Jauberteau, G. J. Meeusen, et al. · Applied Physics Letters · 29
2008 · J Beckers, F Manders, et al. · Journal of Physics D Applied Physics · 25
2006 · W W Stoffels, A H F M Baede, et al. · Measurement Science and Technology · 25
1991 · Gmw Gerrit Kroesen, M. Haverlag · TU/e Research Portal · 25
2006 · A J Flikweert, M van Kemenade, et al. · Journal of Physics D Applied Physics · 23
1995 · W. W. Stoffels, E. Stoffels, et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 23
2010 · Ana Sobota, Freddy Manders, et al. · IEEE Transactions on Plasma Science · 22
2007 · W J M Brok, M F Gendre, et al. · Journal of Physics D Applied Physics · 22
1992 · J. J. Beulens, A. T. M. Wilbers, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 22
2002 · M Haverlag, A Kraus, et al. · Journal of Physics D Applied Physics · 21
Works count: 125
Citation count: 1,607
H-index: 22
I10-index: 47
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