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C. Foss
Observed name:
Foss, C.
Institution:
X-Fab (Germany)
Observed institution:
X-Fab (Germany)
OpenAlex ID:
A5042013673
Test Circuits for Fast and Reliable Assessment of CDM Robustness of I/O stages
2003
·
Stadler, W.
, Esmark, K.
, et al.
·
Publikationsdatenbank der Fraunhofer-Gesellschaft (Fraunhofer-Gesellschaft)
·
13
Test circuits for fast and reliable assessment of CDM robustness of I/O stages
2004
·
W. Stadler
, K. Esmark
, et al.
·
Microelectronics Reliability
·
10
Design-Flow to Support the Simulation, Modelling and Optimization of EMC-Behaviour of Input and Output Stages of CMOS and BICMOS Integrated Circuits
1997
·
C. Foss
·
International Zurich Symposium and Technical Exhibition on Electromagnetic Compatibility
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Works count:
4
Citation count:
23
H-index:
2
I10-index:
2
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