Test circuits for fast and reliable assessment of CDM robustness of I/O stages
Year: 2004
Type: article
Source: Microelectronics Reliability
Authors: W. Stadler, K. Esmark, K. Reynders, M. Zubeidat, M. Graf, W. Wilkening, J. Willemen, N. Qu, S. Mettler, M. Etherton, D. Nuernbergk, H. Wolf, H. Gieser, W. Soppa, V. De Heyn, M. Natarajan, G. Groeseneken, E. Morena, R. Stella, A. Andreini, M. Litzenberger, D. Pogany, E. Gornik, C. Foss, A. Konrad, M. Frank
Institutions: Infineon Technologies (Germany), Robert Bosch (Germany), IMMS Institut für Mikroelektronik- und Mechatronik-Systeme gemeinnützige GmbH (IMMS GmbH), Fraunhofer Institute for Reliability and Microintegration, Hochschule Osnabrück, IMEC, STMicroelectronics (Italy), TU Wien, X-Fab (Germany)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2000522077