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Author

Stephan Mettler

Observed names: Mettler, S., S. Mettler
OpenAlex ID: A5083152816
Analysis of lateral DMOS power devices under ESD stress conditions
2000 · M.P.J. Mergens, W. Wilkening, et al. · IEEE Transactions on Electron Devices · 124
Characterization and modeling of transient device behavior under CDM ESD stress
2004 · J. Willemen, A. Andreini, et al. · Journal of Electrostatics · 55
Analysis and compact modeling of lateral DMOS power devices under ESD stress conditions
2003 · M. Mergens, W. Wilkening, et al. · Electrical Overstress/Electrostatic Discharge Symposium · 46
Modular approach of a high current MOS compact model for circuit-level ESD simulation including transient gate coupling behavior
2003 · M. Mergens, W. Wilkening, et al. · IEEE International Reliability Physics Symposium proceedings · 41
Characterization and optimization of a bipolar ESD-device by measurements and simulations
1998 · A.D. Stricker, M. Mergens, et al. · Electrical Overstress/Electrostatic Discharge Symposium · 28
Measurements and 3D Simulations of Full-Chip Potential Distribution at Parasitic Substrate Current Injection
2000 · M. Schenkel, P. Pfaffli, et al. · European Solid-State Device Research Conference · 15
Study of CDM specific effects for a smart power input protection structure
2005 · M. Etherton, N. Qu, et al. · Microelectronics Reliability · 14
ESD-level circuit simulation-impact of gate RC-delay on HBM and CDM behavior
2002 · M.P.J. Mergens, W. Wilkening, et al. · Electrical Overstress/Electrostatic Discharge Symposium · 14
Surface mobility in silicon at large operating temperature
2003 · S. Reggiani, A. Valdinoci, et al. · International Conference on Simulation of Semiconductor Processes and Devices · 13
Test Circuits for Fast and Reliable Assessment of CDM Robustness of I/O stages
2003 · Stadler, W., Esmark, K., et al. · Publikationsdatenbank der Fraunhofer-Gesellschaft (Fraunhofer-Gesellschaft) · 13
Modular approach of a high current MOS compact model for circuit-level ESD simulation including transient gate-coupling behaviour
2000 · Markus Mergens, Wolfgang Wilkening, et al. · Microelectronics Reliability · 12
Study of CDM specific effects for a smart power input protection structure
2004 · M. Etherton, N. Qu, et al. · Electrical Overstress/Electrostatic Discharge Symposium · 11
Test circuits for fast and reliable assessment of CDM robustness of I/O stages
2004 · W. Stadler, K. Esmark, et al. · Microelectronics Reliability · 10
Verification of CDM circuit simulation using an ESD evaluation circuit
2007 · M. Etherton, J. Willemen, et al. · Microelectronics Reliability · 8
Characterization and optimization of a bipolar ESD-device by measurements and simulations
1999 · Andreas D. Stricker, Stephan Mettler, et al. · Microelectronics Reliability · 8
ESD-level circuit simulation impact of interconnect RC-delay on HBM and CDM behavior
2002 · Markus P.J Mergens, Wolfgang Wilkening, et al. · Journal of Electrostatics · 4
Works count: 16
Citation count: 416
H-index: 11
I10-index: 13
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