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Author

H. Miyamoto

Institution: NEC (Japan)
Observed institution: NEC (Japan)
OpenAlex ID: A5042853759
A 30 ns 64 Mb DRAM with built-in self-test and repair function
2003 · H. Koike, A. Tanabe, et al. · Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference · 10
A 250 Mb/s 1 Gb double data rate SDRAM with a bi-directional delay and an inter-bank shared redundancy scheme
2003 · Y. Takai, M. Fujita, et al. · Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference · 6
Works count: 2
Citation count: 16
H-index: 2
I10-index: 1
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