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A. Haouni

Residual stress in diamond films: origins and modelling
1999 · J. Michler, M. Mermoux, et al. · Thin Solid Films · 99
Confocal Raman imaging for the analysis of CVD diamond films
1999 · A Haouni, M Mermoux, et al. · Diamond and Related Materials · 21
X-ray diffraction study of texture and growth of RF-sputtered CdS films
1990 · A. Bennouna, E.L. Ameziane, et al. · Solar Energy Materials · 18
Grazing-incidence X-ray diffraction study of all-sputtered Al/CdS and CdS/Al interfaces
1991 · A. Bennouna, A. Haouni, et al. · Solar Energy Materials · 4
Contribution à l'analyse par spectroscopie Raman des contraintes résiduelles dans les dépôts de diamant élaborés par MPCVD
2000 · Haouni, Azzouz · Toubkal
PROPERTIES AND TIME-TEMPERATURE DEPENDENCE OF THE DARK CONDUCTIVITY OF SPUTTERED CdS FILMS
1990 · A. Bennouna, A. Haouni, et al. · Elsevier eBooks
X-RAY DIFFRACTION STUDY OF TEXTURE AND GROWTH OF R.F. SPUTTERED CdS FILMS
1990 · A. Bennouna, A. Haouni, et al. · Elsevier eBooks
GRAZING INCIDENCE X-RAY DIFFRACTION STUDY OF ALL-SPUTTERED AL/CdS AND CdS/AL INTERFACES
1990 · A. Bennouna, A. Haouni, et al. · Elsevier eBooks
Works count: 8
Citation count: 142
H-index: 4
I10-index: 3
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