Work

X-ray diffraction study of texture and growth of RF-sputtered CdS films

Year: 1990

Type: article

Source: Solar Energy Materials

DOI: 10.1016/0165-1633(90)90032-v

Authors: A. Bennouna, E.L. Ameziane, A. Haouni, N. Ghermani, M. Azizan, M. Brunel

Institution: Cadi Ayyad University

Language: English

Topic: Chalcogenide Semiconductor Thin Films

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1968709452

FWCI: 3.743

Cites: 12

Cited by: 18

Related to: 10