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K. Kis-Szabo

Observed names: Kis-Szabo, K., Krisztian Kis-Szabo, Krisztián Kis-Szabo, Krisztián Kis-Szabó
Institution: Semilab (Hungary)
OpenAlex ID: A5045509331
QSS-μPCD measurement of lifetime in silicon wafers: advantages and new applications
2011 · Marshall Wilson, Alexandre Savtchouk, et al. · Energy Procedia · 27
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Multifunction metrology platform for photovoltaics
2011 · M. Wilson, J. D'Amico, et al. · Conference record of the IEEE Photovoltaic Specialists Conference · 16
Contactless mobility measurements of inversion charge carriers on silicon substrates with SiO2 and HfO2 gate dielectrics
2010 · J. L. Everaert, E. Rosseel, et al. · Applied Physics Letters · 8
Accurate contact and contactless methods for emitter sheet resistance testing of PV wafers
2019 · Ferenc Korsós, Péter Tüttő, et al. · AIP conference proceedings · 4
Novel Noncontact Approach to Characterization of Mobility in Inversion Layers Using Corona Charging of Dielectric and SPV Monitoring of Sheet Resistance
2010 · JL. Everaert, E. Rosseel, et al. · ECS Transactions · 3
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Junction Photovoltage Metrology and High Resolution Mapping of Ion Implants Electrically Isolated from the Wafer Surface
2008 · Ferenc Korsós, Krisztian Kis-Szabo, et al. · AIP conference proceedings · 3
Contactless measurement of sheet resistance and mobility of inversion charge carriers on photovoltaic wafers
2020 · Ferenc Korsós, Géza László, et al. · Solar Energy Materials and Solar Cells · 2
Ultra-Shallow Junctions Fabrication by Plasma Immersion Implantation on PULSION® Followed by Laser Thermal Processing
2008 · Frank Torregrosa, Hasnaa Etienne, et al. · AIP conference proceedings · 2
Unification of Excess Carrier Lifetime Measurement for Silicon PV
2012 · Wilson, M., Savtchouk, A., et al. · EU PVSEC
Novel Noncontact Approach to Characterization of Mobility in Inversion Layers Using Corona Charging of Dielectric and SPV Monitoring of Sheet Resistance
2010 · JL. Everaert, E. Rosseel, et al. · ECS Meeting Abstracts
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Works count: 10
Citation count: 65
H-index: 4
I10-index: 2
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