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S. Croci

Decay kinetics and thermoluminescence of PbWO4: La3+
1997 · M. Nikl, P. Bohäc̆ek, et al. · Applied Physics Letters · 91
Radiation Damage and Thermoluminescence of Gd-Doped PbWO4
1997 · S. Baccaro, P. Bohacek, et al. · physica status solidi (a) · 38
Thermoluminescence (TL) dating of burnt flints: problems, perspectives and some examples of application
2001 · Marco Martini, Emanuela Sibilia, et al. · Journal of Cultural Heritage · 35
Influence of Gd3+ Concentration on PbWO4:Gd3+ Scintillation Characteristics
2000 · S. Baccaro, P. Boh�?ek, et al. · physica status solidi (a) · 19
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The Effect of Co-Doping by Ca[sup 2+], Ta[sup 5+], Sn[sup 4+], and Ru[sup 4+] Ions on the X-Ray Luminescent Properties of Gd[sub 2]O[sub 2]S:Tb[sup 3+] Phosphors
2003 · R. Morlotti, C. Magro, et al. · Journal of The Electrochemical Society · 11
SiO2 films deposited on silicon at low temperature by plasma-enhanced decomposition of hexamethyldisilazane: Defect characterization
2001 · S. Croci, A. Pêcheur, et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 10
Effect of some technological parameters on Fowler–Nordheim injection through tunnel oxides for non-volatile memories
2001 · S. Croci, C. Plossu, et al. · Journal of Non-Crystalline Solids · 10
Extraction and evolution of Fowler-Nordheim tunneling parameters of thin gate oxides under EEPROM-like dynamic degradation
1999 · S. Croci, J.M. Voisin, et al. · Microelectronics Reliability · 10
Conduction properties of electrically erasable read only memory tunnel oxides under dynamic stress
2001 · C. Plossu, S. Croci, et al. · Journal of Non-Crystalline Solids · 6
Extraction of band diagram parameters from Fowler–Nordheim model in silicon dioxide
2001 · J.P. Sorbier, C. Plossu, et al. · Journal of Non-Crystalline Solids · 4
Capacitance and current–voltage simulation of EEPROM technology highly doped MOS structures
2003 · S. Croci, C. Plossu, et al. · Journal of Materials Science Materials in Electronics · 2
Electronic recombinations and ionic transport in BPSG layers
2001 · A. Vedda, E. Carollo, et al. · Microelectronic Engineering · 2
Glow curves and emission spectra of burnt flints
1999 · M. Martini, E. Sibilia, et al. · Quaternary Science Reviews · 2
The Effect of Co‐Doping by Ca2+, Ta5+, Sn4+, and Ru4+ Ions on the X‐Ray Luminescent Properties of Gd2O2S:Tb3+ Phosphors.
2003 · R. Morlotti, C. Magro, et al. · ChemInform · 1
Effect of nitridation on Fowler–Nordheim tunneling coefficients in SiO2 MOS capacitors with WSi2-polysilicon gate
2001 · S. Croci, C. Plossu, et al. · Journal of Materials Science Materials in Electronics · 1
Trapping and emission centres in PbWO4and CaWO4crystals
1999 · S. Baccaro, P. Bohácek, et al. · Radiation effects and defects in solids · 1
Activity of LUMEN (1996-97) : Understanding of PbWO4 Scintillator Characteristics and their Optimisation
1998 · S. Baccaro, G. Spinolo, et al. · CERN Document Server (European Organization for Nuclear Research) · 1
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Model of leakage current induced by dynamic stress in thin EEPROM tunnel oxides
2003 · J.P. Sorbier, S. Croci, et al. · Journal of Non-Crystalline Solids
Effect of TaSi2 and WSi2 deposition on interfacial defects and Fowler-Nordheim injection in polycide gate SiO2 MOS capacitors
2001 · S. Croci, C. Plossu, et al. · Journal de Physique IV (Proceedings)
Stress Induced Leakage Current under EEPROM like Dynamic Stress
2001 · S. Croci, J.P. Sorbier, et al. · European Solid-State Device Research Conference
Caractérisation et modélisation des propriétés des couches de SiO2 : application aux têtes de lecture-écriture pour disques durs et aux mémoires EEPROM
2001 · S. Croci
Works count: 23
Citation count: 244
H-index: 8
I10-index: 8
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