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José Pineda de Gyvez

Observed names: Dr. Jose Pineda De Gyvez, J Pineda de Gyvez, J. Pineda De Gyvez, J. Pineda de Gyvez, J.P. De Gyvez, J.P. de Gyvez, JOSE PINEDA DE GYVEZ, Jos Pineda de Gyvez, Jose De Gyvez, Jose P. De Gyvez, Jose Pineda De Gyvez, Jose Pineda de Gyvez, Jose Pineda-de Gyvez, Jose de jesus Pineda de Gyvez, José Pineda De Gyvez, José Pineda Gyvez, Pineda De Gyvez, J José, Pineda de Gyvez, J José, Pineda de Gyvez, J., Pineda de Gyvez, Jose, Pineda de Gyvez, José
Observed institutions: NXP (Netherlands), University of California San Diego, Philips (Netherlands), NXP (Germany), Signify (Netherlands), Indian Institute of Technology Delhi, Texas Instruments (United States), Eindhoven University of Technology, Texas A&M University
ORCID: 0000-0002-0723-7065
Observed ORCID: 0000-0002-0723-7065
OpenAlex ID: A5050945839
A capacitor cross-coupled common-gate low-noise amplifier
2005 · W. Zhuo, X. Li, et al. · IEEE Transactions on Circuits and Systems II Analog and Digital Signal Processing · 341
Resistance characterization for weak open defects
2002 · R.R. Montanes, J.P. de Gyvez, et al. · IEEE Design & Test of Computers · 172
Using capacitive cross-coupling technique in RF low noise amplifiers and down-conversion mixer design
2000 · Zhuo Wei, S.H.K. Embabi, et al. · TU/e Research Portal · 149
IC defect sensitivity for footprint-type spot defects
1992 · J. Pineda de Gyvez, C. Di · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 93
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An Ultra-Low-Energy Multi-Standard JPEG Co-Processor in 65 nm CMOS With Sub/Near Threshold Supply Voltage
2010 · Yu Pu, Jose Pineda de Gyvez, et al. · IEEE Journal of Solid-State Circuits · 87
Threshold voltage mismatch and intra-die leakage current in digital CMOS circuits
2004 · J. Pineda de Gyvez, H.P. Tuinhout · IEEE Journal of Solid-State Circuits · 78
Lorenz-based chaotic cryptosystem: a monolithic implementation
2000 · O.A. Gonzales, G. Han, et al. · IEEE Transactions on Circuits and Systems I Fundamental Theory and Applications · 61
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Analog fault diagnosis based on ramping power supply current signature clusters
1996 · S.A.S. Somayajula, E. Sanchez-Sinencio, et al. · IEEE Transactions on Circuits and Systems II Analog and Digital Signal Processing · 57
Color image processing in a cellular neural-network environment
1996 · Chi-Chien Lee, J.P. de Gyvez · IEEE Transactions on Neural Networks · 54
An ultra-low-energy/frame multi-standard JPEG co-processor in 65nm CMOS with sub/near-threshold power supply
2009 · Yu Pu, J.P. de Gyvez, et al. · Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference · 46
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Vdd ramp testing for rf circuits
2004 · J. Pineda de Gyvez, G. Gronthoud, et al. · IEEE International Test Conference (ITC) · 43
Single-layer CNN simulator
2002 · C.-C. Lee, J.P. de Gyvez · IEEE International Symposium on Circuits and Systems proceedings · 41
DNA computing based on chaos
2002 · G. Manganaro, J. Pineda de Gyvez · IEEE Congress on Evolutionary Computation (CEC) · 39
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Standard cell sizing for subthreshold operation
2012 · Bo Liu, Maryam Ashouei, et al. · ACM/IEEE Design Automation Conference (DAC) · 37
CLIM: A Cross-Level Workload-Aware Timing Error Prediction Model for Functional Units
2017 · Xun Jiao, Abbas Rahimi, et al. · IEEE Transactions on Computers · 36
Programmable low noise amplifier with active-inductor load
2002 · W. Zhuo, J.P. de Gyvez, et al. · IEEE International Symposium on Circuits and Systems proceedings · 34
BIST Method for Die-Level Process Parameter Variation Monitoring in Analog/Mixed-Signal Integrated Circuits
2007 · Amir Zjajo, Manuel J. Barragan Asian, et al. · Design, Automation, and Test in Europe · 32
Analog system-level fault diagnosis based on a symbolic method in the frequency domain
1995 · Zhihong You, E. Sanchez-Sinencio, et al. · IEEE Transactions on Instrumentation and Measurement · 32
Time multiplexed color image processing based on a CNN with cell-state outputs
1998 · Lei Wang, J.P. De Gyvez, et al. · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 31
A forward body bias generator for digital CMOS circuits with supply voltage scaling
2010 · Maurice Meijer, Jose Pineda de Gyvez, et al. · IEEE International Symposium on Circuits and Systems proceedings · 29
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Testing and Diagnosis of Power Switches in SOCs
2006 · S.K. Goel, M. Meijer, et al. · IEEE European Test Symposium (ETS) · 29
On-chip digital power supply control for system-on-chip applications
2005 · Maurice Meijer, José Pineda de Gyvez, et al. · International Symposium on Low Power Electronics and Design (ISLPED) · 29
Body-Bias-Driven Design Strategy for Area- and Performance-Efficient CMOS Circuits
2010 · Maurice Meijer, José Pineda de Gyvez · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 28
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Built-in current sensor for ΔI/sub DDQ/ testing
2004 · J.R. Vazquez, J. Pineda de Gyvez · IEEE Journal of Solid-State Circuits · 27
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Stochastic Analysis of Deep-Submicrometer CMOS Process for Reliable Circuits Designs
2010 · Amir Zjajo, Qin Tang, et al. · IEEE Transactions on Circuits and Systems I Regular Papers · 25
Works count: 242
Citation count: 2,802
H-index: 25
I10-index: 69
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