Author

B. Mazza

Observed names: Bruna Mazza, Mazza, Bruna

Observed institutions: University of Messina, STMicroelectronics (Italy)

OpenAlex ID: A5054698665

Multchip SiC-based compact module for automotive applications: A high speed thermal study

2022 · L. Anoldo, G. Malta, et al. · Microelectronics Reliability · 5

Electrical overstress effect characterization on Power MOS Trenchfet and correlation with time dependent dielectric breakdown

2021 · B. Mazza, S. Patanè, et al. · Microelectronics Reliability · 5

Failure analysis addressing method of optically undetected defectivity on 4H-SiC PowerMOSFET epitaxial layer

2022 · S. Alessandrino, B. Carbone, et al. · IEEE International Reliability Physics Symposium proceedings · 2

Effect of interface and bulk charges on the breakdown of nitrided gate oxide on 4H-SiC

2021 · B. Mazza, S. Patane, et al. · IEEE International Reliability Physics Symposium proceedings · 1

Fast Missing Source Contact Electrical Method Detection on Low Voltage TrenchFET Technology

2023 · F. Cordiano, D. Sanfilippo, et al. · IEEE Electron Devices Technology & Manufacturing Conference (EDTM)

High speed thermal mapping on six-pack SiC-based module for hybrid and electric vehicles

2022 · Giuliana Malta, Laura Anoldo, et al. · International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)

Charge–Sensing method for Nickel contamination detection on a 4H-SiC PowerMOSFET

2021 · B. Mazza, F. Cordiano, et al. · IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

Works count: 9

Citation count: 13

H-index: 2

I10-index: