Author

Hirohiko Kitsuki

Observed names: H Kitsuki, H. Kitsuki, Hirohiko KITSUKI
OpenAlex ID: A5058693129
2008 · Hirohiko Kitsuki, Toshishige Yamada, et al. · Applied Physics Letters · 56
2008 · Tsutomu Saito, Toshishige Yamada, et al. · Applied Physics Letters · 37
2008 · Drazen Fabris, Hirohiko Kitsuki, et al. · ASME Heat Transfer Summer Conference (HT) · 7
2007 · Makoto Suzuki, Quoc Ngo, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 5
2007 · Hirohiko Kitsuki, Makoto Suzuki, et al. · IEEE Conference on Nanotechnology (IEEE NANO) · 3
2023 · Muneyuki Fukuda, Kazuhisa Hasumi, et al. · Journal of Micro/Nanopatterning Materials and Metrology · 2
2007 · M Suzuki, H Kitsuki, et al. · Microscopy and Microanalysis · 2
2023 · Muneyuki Fukuda, Kazuhisa Hasumi, et al. · Metrology, Inspection, and Process Control XXXVI · 1
2008 · T. Yamada, M. Suzuki, et al. · IEEE Conference on Nanotechnology (IEEE NANO) · 1
2008 · Tsutomu Saito, Hirohiko Kitsuki, et al. · IEEE Conference on Nanotechnology (IEEE NANO) · 1
2008 · Hirohiko Kitsuki, Tsutomu Saito, et al. · IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) · 1
2008 · Hirohiko Kitsuki, Tsutomu Saito, et al. · IEEE International Interconnect Technology Conference (IITC) · 1
2007 · Alan M. Cassell, Kris Gleason, et al. · TechConnect Briefs · 1
2007 · Hirohiko Kitsuki, Makoto Suzuki, et al. · MRS Proceedings · 1
1998 · Nobuhiro SHIGYO, Kenji ISHIBASHI, et al. · Journal of Nuclear Science and Technology · 1
2008 · Tsutomu Saito, Toshishige Yamada, et al. · IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC)
2008 · Hirohiko Kitsuki, Tsutomu Saito, et al. · IEEE International Conference on Solid-State and Integrated Circuit Technology
2008 · Hirohiko Kitsuki, Tsutomu Saito, et al. · IEEE International Conference on Solid-State and Integrated Circuit Technology
2008 · Tsutomu Saito, Hirohiko Kitsuki, et al. · ASME International Mechanical Engineering Congress and Exposition (IMECE)
2007 · Quoc Ngo, Toshishige Yamada, et al. · IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
Works count: 20
Citation count: 120
H-index: 4
I10-index: 2
Year
Topic
Type