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Kwon‐Shik Park
Observed names:
Kwon-Shik Park,
Kwon-shik Park,
KwonShik Park,
Kwonshik Park,
Kwon‐shik Park
Institution:
LG (South Korea)
Observed institutions:
Yonsei University,
Konkuk University,
LG (South Korea)
OpenAlex ID:
A5059005462
Comparative Study on Performance of IGZO Transistors With Sputtered and Atomic Layer Deposited Channel Layer
2019
·
Min Hoe Cho
, Hyunju Seol
, et al.
·
IEEE Transactions on Electron Devices
·
152
Growth of high-quality semiconducting tellurium films for high-performance p-channel field-effect transistors with wafer-scale uniformity
2022
·
Taikyu Kim
, Cheol Hee Choi
, et al.
·
npj 2D Materials and Applications
·
129
PDF
Impact of cation compositions on the performance of thin-film transistors with amorphous indium gallium zinc oxide grown through atomic layer deposition
2018
·
Min Hoe Cho
, Min Jae Kim
, et al.
·
Journal of Information Display
·
93
PDF
High-Performance Amorphous Indium Gallium Zinc Oxide Thin-Film Transistors Fabricated by Atomic Layer Deposition
2018
·
Min Hoe Cho
, Hyunju Seol
, et al.
·
IEEE Electron Device Letters
·
68
Gallium Doping Effects for Improving Switching Performance of p-Type Copper(I) Oxide Thin-Film Transistors
2020
·
Jun Hyeon Bae
, Jin Hyeok Lee
, et al.
·
ACS Applied Materials & Interfaces
·
67
Study on the Lateral Carrier Diffusion and Source-Drain Series Resistance in Self-Aligned Top-Gate Coplanar InGaZnO Thin-Film Transistors
2019
·
Sae-Young Hong
, Hee-Joong Kim
, et al.
·
Scientific Reports
·
62
PDF
Systematic Decomposition of the Positive Bias Stress Instability in Self-Aligned Coplanar InGaZnO Thin-Film Transistors
2017
·
Sungju Choi
, Juntae Jang
, et al.
·
IEEE Electron Device Letters
·
58
Effect of interfacial excess oxygen on positive-bias temperature stress instability of self-aligned coplanar InGaZnO thin-film transistors
2016
·
Saeroonter Oh
, Ju Heyuck Baeck
, et al.
·
Applied Physics Letters
·
57
Reliability of Crystalline Indium–Gallium–Zinc-Oxide Thin-Film Transistors Under Bias Stress With Light Illumination
2015
·
Kyung Park
, Hyun-Woo Park
, et al.
·
IEEE Transactions on Electron Devices
·
53
Negative threshold voltage shift in an a-IGZO thin film transistor under X-ray irradiation
2019
·
Dong-Gyu Kim
, Jong-Un Kim
, et al.
·
RSC Advances
·
51
PDF
Excessive Oxygen Peroxide Model‐Based Analysis of Positive‐Bias‐Stress and Negative‐Bias‐Illumination‐Stress Instabilities in Self‐Aligned Top‐Gate Coplanar In–Ga–Zn–O Thin‐Film Transistors
2022
·
Sungju Choi
, Jingyu Park
, et al.
·
Advanced Electronic Materials
·
49
Network Structure Modification‐Enabled Hybrid Polymer Dielectric Film with Zirconia for the Stretchable Transistor Applications
2020
·
Jeong Oh Kim
, Jae Seok Hur
, et al.
·
Advanced Functional Materials
·
44
Highly Reliable Amorphous In-Ga-Zn-O Thin-Film Transistors Through the Addition of Nitrogen Doping
2018
·
Kyung Park
, Jong Heon Kim
, et al.
·
IEEE Transactions on Electron Devices
·
41
15‐1: Invited Paper: Manufacturing Technology of LTPO TFT
2020
·
Ui-Jin Chung
, Seung-Chan Choi
, et al.
·
SID Symposium Digest of Technical Papers
·
38
58.2: Distinguished Paper : Implementation of 240Hz 55‐inch Ultra Definition LCD Driven by a‐IGZO Semiconductor TFT with Copper Signal Lines
2012
·
Namyong Gong
, Chonghun Park
, et al.
·
SID Symposium Digest of Technical Papers
·
38
High-Performance Hexagonal Tellurium Thin-Film Transistor Using Tellurium Oxide as a Crystallization Retarder
2022
·
Taikyu Kim
, Cheol Hee Choi
, et al.
·
IEEE Electron Device Letters
·
36
Hydrogen behavior under X-ray irradiation for a-IGZO thin film transistors
2020
·
Dong-Gyu Kim
, Tae-Kwon Lee
, et al.
·
Applied Physics Letters
·
34
7‐4: Invited Paper : Internal Compensation Type OLED Display Using High Mobility Oxide TFT
2017
·
Yong Ho Jang
, Dae Hwan Kim
, et al.
·
SID Symposium Digest of Technical Papers
·
34
Comparison of Top-Gate and Bottom-Gate Amorphous InGaZnO Thin-Film Transistors With the Same SiO2/a-InGaZnO/SiO2Stack
2014
·
Saeroonter Oh
, Ju Heyuck Baeck
, et al.
·
IEEE Electron Device Letters
·
32
Analysis of Drain-Induced Barrier Lowering in InGaZnO Thin-Film Transistors
2022
·
Tae Jun Yang
, Je-Hyuk Kim
, et al.
·
IEEE Transactions on Electron Devices
·
30
Cation Composition-Dependent Device Performance and Positive Bias Instability of Self-Aligned Oxide Semiconductor Thin-Film Transistors: Including Oxygen and Hydrogen Effect
2022
·
Jun Tae Jang
, Donguk Kim
, et al.
·
ACS Applied Materials & Interfaces
·
29
Significant Performance and Stability Improvements of Low-Temperature IGZO TFTs by the Formation of In-F Nanoparticles on an SiO2 Buffer Layer
2020
·
Ho-young Jeong
, Seung-hee Nam
, et al.
·
Nanomaterials
·
28
PDF
The Significance on Structural Modulation of Buffer and Gate Insulator for ALD Based InGaZnO TFT Applications
2021
·
Wan-Ho Choi
, Kyoungrok Kim
, et al.
·
IEEE Transactions on Electron Devices
·
26
P‐5: A‐Si TFT Integrated Gate Driver with AC‐driven Single Pull‐Down Structure
2006
·
Yong Ho Jang
, Soo Young Yoon
, et al.
·
SID Symposium Digest of Technical Papers
·
26
Improvement in Field-Effect Mobility of Indium Zinc Oxide Transistor by Titanium Metal Reaction Method
2015
·
Hyuk Ji
, Ah Young Hwang
, et al.
·
IEEE Transactions on Electron Devices
·
25
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Works count:
83
Citation count:
1,615
H-index:
25
I10-index:
36
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