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John A. Waicukauski

Observed names: J. A. Waicukauski, J. Waicukauski, J.A. Waicukauski, John Waicukauski, JohnA Waicukauski
OpenAlex ID: A5062016144
Transition Fault Simulation
1987 · John Waicukauski, Eric Lindbloom, et al. · IEEE Design & Test of Computers · 399
Failure diagnosis of structured VLSI
1989 · J.A. Waicukauski, E. Lindbloom · IEEE Design & Test of Computers · 283
A method for generating weighted random test patterns
1989 · J. A. Waicukauski, E. Lindbloom, et al. · IBM Journal of Research and Development · 167
On computing the sizes of detected delay faults
1990 · V.S. Iyengar, B.K. Rosen, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 110
X-tolerant compression and application of scan-atpg patterns in a bist architecture
2004 · P. Wohl, J.A. Waicukauski, et al. · IEEE International Test Conference (ITC) · 106
Efficient compression and application of deterministic patterns in a logic BIST architecture
2003 · P. Wohl, J.A. Waicukauski, et al. · ACM/IEEE Design Automation Conference (DAC) · 100
Structured Logic Testing
1990 · E. B. Eichelberger, E. Lindbloom, et al. · Prentice Hall PTR eBooks · 99
Transition Fault Simulation by Parallel Pattern Single Fault Propagation.
1986 · J.A. Waicukauski, Eric Lindbloom, et al. · IEEE International Test Conference (ITC) · 98
Design of compactors for signature-analyzers in built-in self-test
2002 · P. Wohl, J.A. Waicukauski, et al. · IEEE International Test Conference (ITC) · 82
Fault detection effectiveness of weighted random patterns
2003 · J.A. Waicukauski, E. Lindbloom · IEEE International Test Conference (ITC) · 73
ATPG for ultra-large structured designs
2002 · J.A. Waicukauski, P.A. Shupe, et al. · IEEE International Test Conference (ITC) · 70
Diagnosis of BIST Failures by PPSFP simulation
1987 · J.A. Waicukauski · 68
Fully X-tolerant combinational scan compression
2007 · P. Wohl, J.A. Waicukauski, et al. · IEEE International Test Conference (ITC) · 55
Minimizing the Impact of Scan Compression
2007 · P. Wohl, J.A. Waicukauski, et al. · IEEE VLSI Test Symposium (VTS) · 53
Efficient compression of deterministic patterns into multiple prpg seeds
2006 · P. Wohl, J.A. Waicukauski, et al. · IEEE International Test Conference (ITC) · 50
Test data compression
2003 · E.J. McCluskey, D. Burek, et al. · IEEE Design & Test of Computers · 50
Fully X-tolerant, very high scan compression
2010 · Peter Wohl, John A. Waicukauski, et al. · ACM/IEEE Design Automation Conference (DAC) · 49
Effective diagnostics through interval unloads in a BIST environment
2002 · P. Wohl, J.A. Waicukauski, et al. · ACM/IEEE Design Automation Conference (DAC) · 44
Scalable selector architecture for x-tolerant deterministic BIST
2004 · Peter Wohl, John A. Waicukauski, et al. · ACM/IEEE Design Automation Conference (DAC) · 40
A Statistical Calculation of Fault Detection Probabilities By Fast Fault Simulation.
1985 · J.A. Waicukauski, Eric Lindbloom, et al. · IEEE International Test Conference (ITC) · 39
Two-dimensional test data decompressor for multiple scan designs
2002 · N. Zacharia, J. Rajski, et al. · IEEE International Test Conference (ITC) · 32
Scan test data volume reduction in multi-clocked designs with safe capture technique
2003 · V. Jain, J. Waicukauski · IEEE International Test Conference (ITC) · 28
XLBIST: X-Tolerant Logic BIST
2018 · P. Wohl, J.A. Waicukauski, et al. · IEEE International Test Conference (ITC) · 27
Highly efficient parallel ATPG based on shared memory
2010 · X. Cai, P. Wohl, et al. · IEEE International Test Conference (ITC) · 24
Fault Diagnosis in an LSSD Environment.
1981 · Y. Arzoumanian, J.A. Waicukauski · 22
Works count: 60
Citation count: 2,406
H-index: 24
I10-index: 36
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