Work

Test data compression

Year: 2003

Type: article

Source: IEEE Design & Test of Computers

DOI: 10.1109/mdt.2003.1188267

Authors: E.J. McCluskey, D. Burek, B. Koenemann, S. Mitra, J. Patel, J. Rajski, J. Waicukauski

Institution: Stanford University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2087289986

FWCI: 8.86

Cites:

Cited by: 50

Related to: 10