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Peter Thomsen-Schmidt

Observed names: P Thomsen-Schmidt, P. Thomsen-Schmidt, P. Thomsen‐Schmidt, Thomsen-Schmidt, P.
OpenAlex ID: A5070978472
Investigation of the absorption induced damage in ultraviolet dielectric thin films
1997 · Eberhard Welsch, K. Ettrich, et al. · Optical Engineering · 35
Thickness determination for SiO2 films on Si by X-ray reflectometry at the Si K edge
2004 · M Krumrey, M Hoffmann, et al. · Thin Solid Films · 30
Reconstructing surface profiles from curvature measurements
2002 · Clemens Elster, Joachim Gerhardt, et al. · Optik · 24
Characterization of a traceable profiler instrument for areal roughness measurement
2011 · P Thomsen-Schmidt · Measurement Science and Technology · 23
Laser-induced nucleation of crystals in amorphous Ge films
1992 · O. Bostanjoglo, W. Marine, et al. · Applied Surface Science · 17
Standards for the Calibration of Instruments for Dimensional Nanometrology
2005 · L. Koenders, T. Dziomba, et al. · Wiley eBooks · 16
Realisation and metrological characterisation of thickness standards below 100�nm
2004 · P. Thomsen-Schmidt, K. Hasche, et al. · Applied Physics A · 16
Metrological characterization of nanometer film thickness standards for XRR and ellipsometry applications
2003 · Klaus Hasche, Peter Thomsen-Schmidt, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 14
Procedure to approximately estimate the uncertainty of material ratio parameters due to inhomogeneity of surface roughness
2016 · Dorothee Hüser, Jonathan Hüser, et al. · Measurement Science and Technology · 12
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Laser-induced multiple phase transitions in GeTe films traced by time-resolved TEM
1989 · O. Bostanjoglo, P. Thomsen-Schmidt · Applied Surface Science · 10
Laser induced plasma formation by picosecond pulse irradiation
1993 · W. Marine, M. Gerri, et al. · Applied Surface Science · 9
Measurement of steep aspheres: a step forward to nanometer accuracy
2001 · Ingolf Weingaertner, Michael Schulz, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 8
Facility for the curvature-based measurement of the nanotopography of complex surfaces
2000 · Peter Thomsen-Schmidt, Michael Schulz, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 8
Time-resolved TEM of laser-induced structural changes in GeTe films
1990 · O. Bostanjoglo, P. Thomsen-Schmidt · Applied Surface Science · 7
Reliable curvature sensor for measuring the topography of complex surfaces
2000 · Michael Schulz, Peter Thomsen-Schmidt, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 4
Influence of preparation conditions on the laser damage threshold of oxide thin films at 248 nm measured by photoacoustic mirage detection
1994 · Michael Reichling, J. Siegel, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 4
Uncertainty of Cutting Edge Roughness Estimation Depending on Waviness Filtration
2016 · Dorothee Hüser, Peter Thomsen-Schmidt, et al. · Procedia CIRP · 3
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The determination of the atomic mass constant with ion accumulation: status and perspectives
2010 · C Schlegel, M Gläser, et al. · Metrologia · 3
Methods, error influences, and limits for the ultraprecise measurement of slope and figure for large, slightly nonflat, or steep complex surfaces
2000 · Ingolf Weingaertner, Michael Schulz, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 3
UV-laser investigation of dielectric thin films
1996 · K. Ettrich, Holger Blaschke, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 3
Zero phonon lines of the M-center in ZnS crystals
1988 · Axel Hoffmann, Immanuel Broser, et al. · Journal of Luminescence · 3
Deducing light scatter from AFM measurements
2003 · Cornelius Hahlweg, Thomas Rinder, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2
Laser-assisted deposition of optical coatings
1994 · P. Thomsen-Schmidt, D. Schäfer, et al. · Thin Solid Films · 2
Multiple phase transitions investigated by high-speed TEM
1990 · Oleg Bostanjoglo, Peter Thomsen-Schmidt · Proceedings annual meeting Electron Microscopy Society of America · 1
Procedure to Approximately Estimate the Uncertainty of Material Ratio Parameters in Roughness Metrology
2016 · Dorothee Hüser, Jonathan Hüser, et al. · arXiv (Cornell University)
Works count: 32
Citation count: 257
H-index: 10
I10-index: 10
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