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Masami Naitou
Observed name:
Masaru Naitou
Institution:
Denso (Japan)
Observed institution:
Denso (Japan)
OpenAlex ID:
A5073780354
Analysis and Reduction of Stacking Faults in Fast Epitaxial Growth
2016
·
Hideyuki Uehigashi
, Keisuke Fukada
, et al.
·
Materials science forum
·
19
Advances in Fast Epitaxial Growth of 4H-SiC and Defect Reduction
2016
·
Hidekazu Tsuchida
, Isaho Kamata
, et al.
·
Materials science forum
·
12
Evolution of Fast 4H-SiC CVD Growth and Defect Reduction Techniques
2014
·
Hidekazu Tsuchida
, Isaho Kamata
, et al.
·
Materials science forum
·
5
Three Kinds of Via Electromigration Failure Mode in Multilevel Interconnections
1992
·
Takahisa Yamaha
, Masaru Naitou
, et al.
·
IEEE International Reliability Physics Symposium proceedings
·
4
Fast 4H-SiC Epitaxial Growth on 150 mm Diameter Area with High-Speed Wafer Rotation
2014
·
Hiroaki Fujibayashi
, Masahiko Ito
, et al.
·
Materials science forum
·
3
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Works count:
5
Citation count:
43
H-index:
4
I10-index:
2
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