Author

Christopher Mounet

Observed names: C. Mounet, Mounet, Christopher
ORCID: 0000-0001-6103-7833
Observed ORCID: 0000-0001-6103-7833
OpenAlex ID: A5073786332
2011 · Alexandre Siligaris, Olivier Richard, et al. · IEEE Journal of Solid-State Circuits · 180
2010 · Alexandre Siligaris, Yasuhiro Hamada, et al. · IEEE Journal of Solid-State Circuits · 71
2021 · T. Francois, J. Coignus, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 46
2011 · Alexandre Siligaris, Olivier Richard, et al. · Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference · 45
2014 · P. Nguyen, S. Barraud, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 34
2022 · T. Francois, J. Coignus, et al. · IEEE Transactions on Electron Devices · 31
2007 · A. Siligaris, C. Mounet, et al. · Digest of papers - IEEE Radio Frequency Integrated Circuits Symposium · 29
2009 · Alexandre Siligaris, Yasuhiro Hamada, et al. · European Solid-State Circuits Conference (ESSCIRC) · 19
2008 · A. Siligaris, C. Mounet, et al. · IEEE International Conference on IC Design and Technology (ICICDT) · 17
2010 · A. Siligaris, C. Mounet, et al. · Lecture notes in electrical engineering · 6
2018 · Reda Boumchedda, Adam Makosiej, et al. · IEEE Solid-State Circuits Letters · 4
2008 · Christopher Mounet, Alexandre Siligaris, et al. · IEEE International Conference on Microwaves, Communications, Antennas and Electronic Systems (COMCAS) · 4
2024 · Panagiota Papavramidou, Sebastien Ricavy, et al. · IEEE International On-Line Testing Symposium (IOLTS) · 3
2006 · Dominique Morche, Frederic Hameau, et al. · IEEE International Conference on Electronics, Circuits and Systems (ICECS) · 3
2005 · E. de Foucauld, G. Billiot, et al. · IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) · 3
2012 · Matthieu Dubois, Emeric De Foucauld, et al. · IEEE International Test Conference (ITC) · 1
Works count: 19
Citation count: 500
H-index: 9
I10-index: 9
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