Author

Hee Yeon Noh

Institutions: Daegu Gyeongbuk Institute of Science and Technology, Kyungpook National University

Observed institutions: Daegu Gyeongbuk Institute of Science and Technology, Kyungpook National University

ORCID: 0000-0001-6847-0648

Observed ORCID: 0000-0001-6847-0648

OpenAlex ID: A5080101296

Hydrogen diffusion and its electrical properties variation as a function of the IGZO stacking structure

2022 · Hee Yeon Noh, Woo-Geun Lee, et al. · Scientific Reports · 67

Role of Hydrogen in Active Layer of Oxide-Semiconductor-Based Thin Film Transistors

2019 · Hee Yeon Noh, Joonwoo Kim, et al. · Crystals · 60

Polymer-dispersed liquid crystal devices with graphene electrodes

2015 · Seok-Hwan Chung, Hee Yeon Noh · Optics Express · 34

Analysis of the hump phenomenon and needle defect states formed by driving stress in the oxide semiconductor

2019 · Hyeon-Jun Lee, Katsumi Abe, et al. · Scientific Reports · 31

Interface roughness effects and relaxation dynamics of an amorphous semiconductor oxide-based analog resistance switching memory

2023 · G. R. Haripriya, Hee Yeon Noh, et al. · Nanoscale · 21

Highly Bright Flexible Electroluminescent Devices with Retroreflective Electrodes

2017 · Hyunseok Shim, Bunyod Allabergenov, et al. · Advanced Materials Technologies · 21

Color-tunable stacked organic light-emitting diode with semi-transparent metal electrode

2016 · Seok-Hwan Chung, Hee Yeon Noh · Optical Materials Express · 9

Study of Weight Quantization Associations over a Weight Range for Application in Memristor Devices

2024 · Yerim Kim, Hee Yeon Noh, et al. · Micromachines · 6

Transfer Printing Method to Obtain Polarized Light Emission in Organic Light-Emitting Device

2012 · Hee Yeon Noh, Chang-sub Park, et al. · Japanese Journal of Applied Physics · 4

Exploring the Impact of Deposition Conditions on the Functionality of a -IGZO/AlO x -Based Sandwich Structures with Memory Effects

2025 · Haripriya G. R., Hee Yeon Noh, et al. · ACS Applied Electronic Materials · 3

Edge-Induced Current Crowding and Joule Heating–Driven Degradation in Hydrogen-Ion-Modulated Oxide Memory Devices

2026 · Hee Yeon Noh, G.R. Haripriya, et al. · Microelectronic Engineering

Metal-overlayer-assisted single-wavelength thermoreflectance imaging for microscale thermal characterization in semiconductor devices

2026 · Hee Yeon Noh, Katsumi Abe, et al. · Journal of Science Advanced Materials and Devices

Tunable Hydrogen Dynamics Under Electrical Bias for Neuromorphic Memory Applications

2026 · Hee Yeon Noh, Chan-Kang Lee, et al. · ACS Applied Materials & Interfaces

Flexible Electroluminescent Devices: Highly Bright Flexible Electroluminescent Devices with Retroreflective Electrodes (Adv. Mater. Technol. 9/2017)

2017 · Hyunseok Shim, Bunyod Allabergenov, et al. · Advanced Materials Technologies

P‐25: 3‐D Surface Profilometry for Accurate Extraction of Depth Profile with LC Phase Modulator

2012 · Kyung‐Il Joo, Hee Yeon Noh, et al. · SID Symposium Digest of Technical Papers

Works count: 15

Citation count: 256

H-index: 7

I10-index: 6