Author

Scott R. Summerfelt

Observed names: S. R. SUMMERFELT, S. R. Summerfelt, S. Summerfelt, S.R. Summerfelt, Scott Summerfelt, Scott. R. Summerfelt
OpenAlex ID: A5083159302
2018 · Si Joon Kim, Jaidah Mohan, et al. · JOM · 367
1996 · A.I. Kingon, S.K. Streiffer, et al. · MRS Bulletin · 228
2012 · Stefan Mueller, Scott R. Summerfelt, et al. · IEEE Electron Device Letters · 162
2004 · H.P. McAdams, R. Acklin, et al. · IEEE Journal of Solid-State Circuits · 123
2004 · J.A. Rodriguez, K. Remack, et al. · IEEE Transactions on Device and Materials Reliability · 112
1989 · M. Grant Norton, Lisa A. Tietz, et al. · Applied Physics Letters · 101
1990 · M. Grant Norton, Scott R. Summerfelt, et al. · Applied Physics Letters · 92
2018 · Si Joon Kim, Jaidah Mohan, et al. · Applied Physics Letters · 88
2013 · S. C. Bartling, S. Khanna, et al. · Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference · 72
2010 · J. Rodriguez, K. Remack, et al. · IEEE International Reliability Physics Symposium proceedings · 63
1995 · W. Y. Hsu, J. D. Luttmer, et al. · Applied Physics Letters · 54
2003 · T.S. Moise, S.R. Summerfelt, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 50
2019 · Si Joon Kim, Jaidah Mohan, et al. · Applied Physics Letters · 39
2001 · S. R. Summerfelt, T. S. Moise, et al. · Applied Physics Letters · 39
2001 · Tomoyuki Sakoda, Theodore S. Moise, et al. · Japanese Journal of Applied Physics · 32
2018 · Si Joon Kim, Jaidah Mohan, et al. · IEEE International Memory Workshop (IMW) · 30
1997 · Paul C. McIntyre, Scott R. Summerfelt, et al. · Applied Physics Letters · 27
1994 · Scott R. Summerfelt, Dave Kotecki, et al. · MRS Proceedings · 27
1997 · Scott R. Summerfelt · Springer eBooks · 24
2013 · K. R. Udayakumar, T. San, et al. · IEEE International Memory Workshop (IMW) · 22
Works count: 107
Citation count: 2,912
H-index: 24
I10-index: 48
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