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Bryan Tracy

Observed name: B Tracy
OpenAlex ID: A5084470947
TEM validation of CD AFM image reconstruction
2007 · Gregory A. Dahlen, Lars Mininni, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 17
TEM validation of CD AFM image reconstruction: part II
2008 · Gregory A. Dahlen, Hao-Chih Liu, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 9
Measurement uncertainty in nanometrology: leveraging attributes of TEM and CD AFM
2007 · Hao-Chih Liu, Gregory A. Dahlen, et al. · Conference proceedings - IEEE Instrumentation/Measurement Technology Conference · 5
A novel and robust method for the accurate magnification characterization and calibration of out-of-fab SEM cluster tools
2004 · Al Sicignano, Arkady Nikitin, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1
Low-Energy X-ray Microanalysis: Mitigating Pathological EDS Peak Overlaps Below 500eV - Carbon on Silver as a Model System
2026 · Bryan Tracy · Proceedings - International Symposium for Testing and Failure Analysis
The Removal of Surface Carbon and Silver Oxide from Contaminated Silver Surfaces to Produce Metallic Silver Using Forming Gas in a Downstream Plasma
2026 · Bryan Tracy, Larry Tran, et al. · Microscopy and Microanalysis
Metrology and In-line Device Characterization
2015 · Bryan Tracy
The Use of Analytical Electron Microscopy for the Complete Characterization of IC Customer Returns
2007 · B Tracy, S Li, et al. · Microscopy and Microanalysis
Experience with a Dicing Saw for Rapid Pre-FIB TEM Sample Preparation
2005 · Jim Conner, James Beck, et al. · Microscopy Today
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Nanocal calibration and pitch recertification of a Hitachi microscale standard
2004 · Dmitry Yeremin, Arkady Nikitin, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
Works count: 10
Citation count: 32
H-index: 3
I10-index: 1
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