Author

Peter D. Carleson

Observed names: P. Carleson, P. D. Carleson, P.D. Carleson, Peter Carleson

Observed institution: Thermo Fisher Scientific (Japan)

OpenAlex ID: A5085582115

Copper device editing: Strategy for focused ion beam milling of copper

2002 · J. David Casey, Michael Phaneuf, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 31

Spatio-spectral characteristics of a high power, high brightness CW InGaAs/AlGaAs unstable resonator semiconductor laser

1993 · Z. Bao, R.K. DeFreez, et al. · Electronics Letters · 13

Plasma FIB DualBeam Delayering for Atomic Force NanoProbing of 14 nm FinFET Devices in an SRAM Array

2015 · Roger Alvis, Trevan Landin, et al. · Proceedings - International Symposium for Testing and Failure Analysis · 9

High-brightness unstable resonator semiconductor lasers

1993 · Richard K. DeFreez, Zhuoyu Bao, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 6

Developing functional Prototypes by package modification using plasma FIB technology

2012 · Michael Gonzales, Roddy Cruz, et al. · IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) · 3

End point of silicon milling using an optical beam induced current signal for controlled access to integrated circuits for backside circuit editing

2002 · N. Antoniou, N. J. Bassom, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2

Advanced sub 0.13µm Cu Devices – Failure Analysis and Circuit Edit With Improved FIB Chemical Processes and Beam Characteristics

2002 · J. David Casey, Thomas J. Gannon, et al. · Proceedings - International Symposium for Testing and Failure Analysis · 2

Design considerations for high-power GaInP/AlGaInP unstable-resonator semiconductor lasers

1993 · Zhuoyu Bao, Richard K. DeFreez, et al. · Applied Optics · 2

High-power unstable resonator semiconductor laser

1992 · Richard K. DeFreez, Zhu Bao, et al. · Conference on Lasers and Electro-Optics · 1

PFIB-SEM wafer DualBeam applications for ground truth in-fab 3D NAND metrology

2026 · Mark Najarian, Joel LeBret, et al. · Metrology, Inspection, and Process Control XXXVI

Perfect TEM Membranes by focused ion beams: A stress reduction technique

1996 · John F. Walker, James K. Odum, et al. · Proceedings annual meeting Electron Microscopy Society of America

Works count: 11

Citation count: 69

H-index: 4

I10-index: 2