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Perfect TEM Membranes by focused ion beams: A stress reduction technique

Year: 1996

Type: article

Source: Proceedings annual meeting Electron Microscopy Society of America

DOI: 10.1017/s0424820100167615

Authors: John F. Walker, James K. Odum, Peter D. Carleson

Language: English

Topic: Advanced Materials Characterization Techniques

Subfield: General Materials Science

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W3035866003

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