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I.-H. Lee
Observed name:
I-H. Lee
Institution:
Jeonbuk National University
Observed institutions:
Yale University,
Jeonbuk National University
OpenAlex ID:
A5086336255
Nitrogen-polar GaN growth evolution on c-plane sapphire
2008
·
Q. Sun
, Y. S. Cho
, et al.
·
Applied Physics Letters
·
74
Comparison of hole traps in n-GaN grown by hydride vapor phase epitaxy, metal organic chemical vapor deposition, and epitaxial lateral overgrowth
2011
·
A. Y. Polyakov
, I.-H. Lee
, et al.
·
Journal of Applied Physics
·
55
Fermi level pinning in heavily neutron-irradiated GaN
2006
·
A. Y. Polyakov
, N. B. Smirnov
, et al.
·
Journal of Applied Physics
·
41
Effect of electron beam irradiation on the electrical and optical properties of ITO/Ag/ITO and IZO/Ag/IZO films
2011
·
C.H. Hong
, Y.J. Jo
, et al.
·
Thin Solid Films
·
32
Spatially resolved photoluminescence and Raman mapping of epitaxial GaN laterally overgrown on sapphire
2010
·
J.-S. Song
, H. Rho
, et al.
·
Physical Review B
·
32
Electrical properties and deep traps spectra of a-plane GaN films grown on r-plane sapphire
2009
·
A.Y. Polyakov
, N.B. Smirnov
, et al.
·
Materials Science and Engineering B
·
27
Neutron irradiation effects in AlGaN/GaN heterojunctions
2006
·
A.Y. Polyakov
, N.B. Smirnov
, et al.
·
Physica B Condensed Matter
·
21
Electrical and luminescent properties and deep traps spectra of N-polar GaN films
2009
·
A.Y. Polyakov
, N.B. Smirnov
, et al.
·
Materials Science and Engineering B
·
10
a -plane GaN hydride vapor phase epitaxy on a-plane GaN templates with and without use of TiN intermediate layers
2010
·
A. Y. Polyakov
, A. V. Markov
, et al.
·
Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena
·
1
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Works count:
9
Citation count:
293
H-index:
8
I10-index:
8
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